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USB3320C-EZK 参数 Datasheet PDF下载

USB3320C-EZK图片预览
型号: USB3320C-EZK
PDF下载: 下载PDF文件 查看货源
内容描述: 高度集成的全功能高速USB 2.0 ULPI收发器 [Highly Integrated Full Featured Hi-Speed USB 2.0 ULPI Transceiver]
分类和应用: 电信集成电路PC
文件页数/大小: 82 页 / 1397 K
品牌: SMSC [ SMSC CORPORATION ]
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Highly Integrated Full Featured Hi-Speed USB 2.0 ULPI Transceiver  
Datasheet  
8.3.1  
Human Body Model (HBM) Performance  
HBM testing verifies the ability to withstand the ESD strikes like those that occur during handling and  
manufacturing, and is done without power applied to the IC. To pass the test, the device must have  
no change in operation or performance due to the event. All pins on the USB3320 except the REFCLK,  
SPK_L, and SPK_R pins provide ±8kV HBM protection, as shown in Table 4.10.  
8.3.2  
EN/IEC 61000-4-2 Performance  
The EN/IEC 61000-4-2 ESD specification is an international standard that addresses system-level  
immunity to ESD strikes while the end equipment is operational. In contrast, the HBM ESD tests are  
performed at the device level with the device powered down.  
SMSC contracts with Independent laboratories to test the USB3320 to EN/IEC 61000-4-2 in a working  
system. Reports are available upon request. Please contact your SMSC representative, and request  
information on 3rd party ESD test results. The reports show that systems designed with the USB3320  
can safely provide the ESD performance shown in Table 4.10 without additional board level protection.  
In addition to defining the ESD tests, EN/IEC 61000-4-2 also categorizes the impact to equipment  
operation when the strike occurs (ESD Result Classification). The USB3320 maintains an ESD Result  
Classification 1 or 2 when subjected to an EN/IEC 61000-4-2 (level 4) ESD strike.  
Both air discharge and contact discharge test techniques for applying stress conditions are defined by  
the EN/IEC 61000-4-2 ESD document.  
8.3.3  
8.3.4  
Air Discharge  
To perform this test, a charged electrode is moved close to the system being tested until a spark is  
generated. This test is difficult to reproduce because the discharge is influenced by such factors as  
humidity, the speed of approach of the electrode, and construction of the test equipment.  
Contact Discharge  
The uncharged electrode first contacts the USB connector to prepare this test, and then the probe tip  
is energized. This yields more repeatable results, and is the preferred test method. The independent  
test laboratories contracted by SMSC provide test results for both types of discharge methods.  
SMSC USB3320  
Revision 1.0 (07-14-09)  
DATA7S7HEET  
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