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LPC47M10X_07 参数 Datasheet PDF下载

LPC47M10X_07图片预览
型号: LPC47M10X_07
PDF下载: 下载PDF文件 查看货源
内容描述: 100引脚增强型超级I / O控制器, LPC接口为消费类应用 [100 Pin Enhanced Super I/O Controller with LPC Interface for Consumer Applications]
分类和应用: 控制器PC
文件页数/大小: 188 页 / 1031 K
品牌: SMSC [ SMSC CORPORATION ]
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APPENDIX - TEST MODE  
Board Test Mode  
Board test mode can be entered as follows:  
On the rising (deasserting) edge of nPCI_RESET, drive nLFRAME low and drive LAD[0] low.  
Exit board test mode as follows:  
On the rising (deasserting) edge of nPCI_RESET, drive either nLFRAME or LAD[0] high.  
See the “XNOR-Chain Test Mode” section below for a description of this board test mode.  
XNOR-CHAIN TEST MODE  
XNOR-Chain test structure allows users to confirm that all pins are in contact with the motherboard during assembly  
and test operations. See Figure 39 below.  
The XNOR-Chain test structure must be activated to perform these tests. When the XNOR-Chain is activated, the  
LPC47M10x pin functions are disconnected from the device pins, which all become input pins except for one output  
pin at the end of XNOR-Chain.  
The tests that are performed when the XNOR-Chain test structure is activated require the board-level test hardware  
to control the device pins and observe the results at the XNOR-Chain output pin.  
The XNOR-Chain output pin is pin 52, GP31/FAN_TACH1. The nPCI_RESET pin and the power and ground pins are  
not included in the XNOR-Chain. See the following subsections for more details.  
I/O#3  
I/O#1  
I/O#2  
XNor  
Out  
I/O#n  
FIGURE 39 - XNOR-CHAIN TEST STRUCTURE  
Page 185  
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