SUD50P06-15 参数 Datasheet PDF下载

SUD50P06-15

P-Channel 60 V (D-S) MOSFET

SPECIFICATIONS

(T

J

= 25 °C, unless otherwise noted)

Parameter

Static

Drain-Source Breakdown Voltage

Gate Threshold Voltage

Gate-Body Leakage

Zero Gate Voltage Drain Current

On-State Drain Current

a

V

DS

V

GS(th)

I

GSS

I

DSS

I

D(on)

V

GS

= 0 V, I

D

= - 250 µA

V

DS

= V

GS

, I

D

= - 250 µA

V

DS

= 0 V, V

GS

= ± 20 V

V

DS

= - 60 V, V

GS

= 0 V

V

DS

= - 60 V, V

GS

= 0 V, T

J

= 125 °C

V

DS

= - 60 V, V

GS

= 0 V, T

J

= 150 °C

V

DS

= -5 V, V

GS

= - 10 V

V

GS

= - 10 V, I

D

= - 17 A

Drain-Source On-State Resistance

a

R

DS(on)

V

GS

= - 10 V, I

D

= - 50 A, T

J

= 125 °C

V

GS

= - 10 V, I

D

= - 50 A, T

J

= 150 °C

V

GS

= - 4.5 V, I

D

= - 14 A

Forward Transconductance

Dynamic

b

Input Capacitance

Output Capacitance

Reverse Transfer Capacitance

Total Gate Charge

c

Gate-Source Charge

c

Gate-Drain Charge

c

Turn-On Delay Time

c

Rise

Time

c

Turn-Off Delay Time

c

Fall Time

c

Continuous Current

Pulsed Current

Forward Voltage

a

Reverse Recovery Time

C

iss

C

oss

C

rss

Q

g

Q

gs

Q

gd

t

d(on)

t

r

t

d(off)

t

f

°C

b

- 50

- 80

I

F

= - 50 A, V

GS

= 0 V

I

F

= - 50 A, dI/dt = 100 A/µs

-1

45

- 1.6

70

A

V

ns

I

S

I

SM

V

SD

t

rr

V

DD

= - 30 V, R

L

= 0.6



I

D



- 50 A, V

GEN

= - 10 V, R

G

= 6



V

DS

= - 30 V, V

GS

= - 10 V, I

D

= - 50 A

V

GS

= 0 V, V

DS

= - 25 V, f = 1 MHz

4950

480

405

110

19

28

15

70

175

175

23

105

260

260

ns

165

nC

pF

a

Symbol

Test Conditions

Min.

- 60

-1

Typ.

Max.

Unit

-3

± 100

-1

- 50

- 100

V

nA

µA

A

- 50

0.012

0.015

0.025

0.028

0.020

61



g

fs

V

DS

= - 15 V, I

D

= - 17 A

S

Source-Drain Diode Ratings and Characteristics

T

C

= 25

Notes:

a. Pulse test; pulse width



300 µs, duty cycle



2 %.

b. Guaranteed by design, not subject to production testing.

c. Independent of operating temperature.

Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation

of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum

rating conditions for extended periods may affect device reliability.

2/7

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