AO4706
30V N-Channel MOSFET
Gate Charge Test Circuit & Waveform
Vgs
Qg
10V
+
VD
C
-
DUT
Vgs
Ig
+
VDC
20A
Vds
Qgs
Q
gd
10A
5A
-
Charge
Resistive Switching Test Circuit & Waveforms
R
L
Vds
Vds
Vgs
Rg
DU
T
VD
C
+
125ºC
Vdd
90%
di/dt=1000A/us
125ºC
-
25ºC
trr
125ºC
10%
Vgs
25ºC
t
d(off)
t
off
t
f
Vgs
Qrr
Irm
t
d(on)
t
r
t
on
25ºC
25ºC
S
125ºC
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms
L
Vds
Id
Vgs
Rg
Is=20A
E
AR
1/2 LI
=
Vds
Vgs
2
AR
BV
DSS
VDC
+
Vdd
-
Id
125ºC
25ºC
25ºC
Vgs
125ºC
I
AR
Is=20A
DU
T
Vgs
125º
Qrr
Diode Recovery Test Circuit & Waveforms
25ºC
25ºC
Vds +
Irm
DUT
Q
rr
= - Idt
Vgs
125ºC
Vds -
Isd
Vgs
L
Isd
I
F
dI/dt
I
RM
t
rr
VD
C
+
Vdd
-
Vds
Vdd
Ig
6/6
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