S3C4510B 参数 Datasheet PDF下载

型号：	S3C4510B
PDF下载：	下载PDF文件查看货源
内容描述：	三星S3C4510B的16位/ 32位RISC微控制器是一款高性价比，高性能的基于以太网的系统微控制器解决方案。 [Samsungs S3C4510B 16/32-bit RISC microcontroller is a cost-effective, high-performance microcontroller solution for Ethernet-based systems.]
分类和应用：	微控制器以太网
文件页数/大小：	422 页 / 2160 K
品牌：	SAMSUNG [ SAMSUNG ]

S3C4510B

APPENDIX A

TEST ACCESS PORT

This section describes relevant sections of the IEEE Standard 1149.1 Compatible Test Access Port (TAP). This

standard applies to the Test Access Port and Boundary Scan (JTAG) specification, which is supported by the

S3C4510B microcontoller.

In test mode, package pads are monitored by the serial scan circuitry. This is done to support connectivity testing

during manufacturing, as well as system diagnostics. JTAG control is not used to drive internal data out of the

S3C4510B.

To conform with IEEE 1194.1, the S3C4510B has a TAP controller, an instruction register, a bypass register, and

an ID register. These components are described in detail below.

A-1