DDR2 SDRAM
256MB, 512MB Registered DIMMs
Operating Temperature Condition
Symbol
Parameter
Rating
Units
Notes
TOPER
Operating Temperature
0 to 95
°C
1, 2, 3
1. Operating Temperature is the case surface temperature on the center/top side of the DRAM. For the measurement conditions, please refer to
JESD51.2 standard.
2. At 0 - 85 °C, operation temperature range are the temperature which all DRAM specification will be supported.
3. At 85 - 95 °C operation temperature range, doubling refresh commands in frequency to a 32ms period ( tREFI=3.9 us ) is required, and to enter to
self refresh mode at this temperature range, an EMRS command is required to change internal refresh rate.
Input DC Logic Level
Symbol
(DC)
Parameter
Min.
+ 0.125
Max.
V + 0.3
DDQ
Units
V
V
Notes
Notes
V
DC input logic high
DC input logic low
V
IH
REF
V (DC)
- 0.3
V
- 0.125
REF
IL
Input AC Logic Level
DDR2-400, DDR2-533
DDR2-667
Symbol
Parameter
Units
Min.
+ 0.250
Max.
Min.
V + 0.200
REF
Max.
V
(AC)
AC input logic high
AC input logic low
V
-
V
V
IH
REF
V (AC)
-
V
- 0.250
V
- 0.200
REF
IL
REF
AC Input Test Conditions
Symbol
Condition
Value
0.5 * V
Units
Notes
V
Input reference voltage
V
V
1
1
REF
DDQ
V
Input signal maximum peak to peak swing
Input signal minimum slew rate
1.0
1.0
SWING(MAX)
SLEW
V/ns
2, 3
Notes:
1. Input waveform timing is referenced to the input signal crossing through the V
(AC) level applied to the device under test.
IH/IL
2. The input signal minimum slew rate is to be maintained over the range from V
to V (AC) min for rising edges and the range from V
to V (AC)
REF IL
REF
IH
max for falling edges as shown in the below figure.
3. AC timings are referenced with input waveforms switching from V (AC) to V (AC) on the positive transitions and V (AC) to V (AC) on the negative
IL
IH
IH
IL
transitions.
V
V
V
V
V
V
V
DDQ
(AC) min
IH
IH
(DC) min
V
SWING(MAX)
REF
(DC) max
IL
IL
(AC) max
SS
delta TF
V
delta TR
- V (AC) max
IL
V
(AC) min - V
delta TR
REF
IH
REF
Falling Slew =
Rising Slew =
delta TF
< AC Input Test Signal Waveform >
Rev. 1.3 Aug. 2005