LM393DR/PWR/DGKR,LM2903DR/PWR/DGKR/VQDR/VQPWR
LM339DR/PWR,LM2901DR/PWR/VQDR/VQPWR
Technical Note
●Description of Electrical Characteristics
Described below are descriptions of the relevant electrical terms.
Please note that item names, symbols, and their meanings may differ from those on another manufacturer’s documents.
1. Absolute maximum ratings
The absolute maximum ratings are values that should never be exceeded, since doing so may result in deterioration of electrical
characteristics or damage to the part itself as well as peripheral components.
1.1 Power supply voltage (Vcc/GND)
Expresses the maximum voltage that can be supplied between the positive and negative power supply terminals without causing
deterioration of the electrical characteristics or destruction of the internal circuitry.
1.2 Differential input voltage (VID)
Indicates the maximum voltage that can be supplied between the non-inverting and inverting terminals without damaging the IC.
1.3 Input common-mode voltage range (VICR)
Signifies the maximum voltage that can be supplied to non-inverting and inverting terminals without causing deterioration of the electrical
characteristics or damage to the IC itself. Normal operation is not guaranteed within the input common-mode voltage range of the
maximum ratings – use within the input common-mode voltage range of the electric characteristics instead.
1.4 Operating temperature range and storage temperature range (Topr,Tstg)
The operating temperature range indicates the temperature range within which the IC can operate. The higher the ambient temperature,
the lower the power consumption of the IC. The storage temperature range denotes the range of temperatures the IC can be stored
under without causing excessive deterioration of the electrical characteristics.
1.5 Power dissipation (Pd)
Indicates the power that can be consumed by a particular mounted board at ambient temperature (25°C). For packaged products, Pd is
determined by maximum junction temperature and the thermal resistance.
2. Electrical characteristics
2.1 Input offset voltage (VIO)
Signifies the voltage difference between the non-inverting and inverting terminals. It can be thought of as the input voltage difference
required for setting the output voltage to 0V.
2.2 Input offset current (IIO)
Indicates the difference of the input bias current between the non-inverting and inverting terminals.
2.3 Input bias current (IIB)
Denotes the current that flows into or out of the input terminal, it is defined by the average of the input bias current at the non-inverting
terminal and the input bias current at the inverting terminal.
2.4 Input common-mode voltage range (VICR)
Indicates the input voltage range under which the IC operates normally.
2.5 Large signal differential voltage gain (AVD)
The amplifying rate (gain) of the output voltage against the voltage difference between the non-inverting and inverting terminals, it is
(normally) the amplifying rate (gain) with respect to DC voltage.
AVD = (output voltage fluctuation) / (input offset fluctuation)
2.6 Supply current (ICC)
Indicates the current of the IC itself that flows under specific conditions and during no-load steady state.
2.7 Low level output current (IOL)
Denotes the maximum current that can be output under specific output conditions.
2.8 Low level output voltage (VOL)
Signifies the voltage range that can be output under specific output conditions.
2.9 High level output current (IOH)
Indicates the current that flows into the IC under specific input and output conditions.
2.10 Response time (tre)
The interval between the application of input and output conditions.
2.11 Common-mode rejection ratio (CMRR)
Denotes the ratio of fluctuation of the input offset voltage when the in-phase input voltage is changed (DC fluctuation).
CMRR = (change of input common-mode voltage) / (input offset fluctuation)
2.12 Power supply rejection ratio (PSRR)
Signifies the ratio of fluctuation of the input offset voltage when the supply voltage is changed (DC fluctuation).
PSRR = (change in power supply voltage) / (input offset fluctuation)
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2011.06 - Rev.B
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