R3130N×××A/C, R3131N×××A/C
TEST CIRCUITS
• Test Circuit for Supply Current
• Test Circuit for Detector Threshold
(CMOS Output type; pull-up part is not neces-
sary.)
I
SS
5V
V
DD
V
DD
470kΩ
R313×N
Series
R313×N
Series
V
OUT
V
IN
V
IN
OUT
OUT
GND
GND
• Test Circuit for “H” Output Voltage
• Test Circuit for “L” Output Voltage
(CMOS Output Type only)
VDD
V
DD
OUT
OUT
R313×N
Series
R313×N
Series
VIN
VIN
VOH
VOL
V
V
GND
GND
IOUT
IOUT
• Test Circuit for Off Leakage Current
• Test Circuit for Output Delay Time
(CMOS Output type; pull-up is not necessary.)
(VDET)+1.0V
V
DD
Input
Voltage
V
DD
Ioz
1.0V
GND
R313×N
Series
V
IN
V
OUT
OUT
R313×N
Series
V
IN
V
DS
OUT
100%
50%
R3130N Series
Output
Voltage
GND
GND
R3131N Series
Tdelay
GND
20
RICOH [ RICOH ELECTRONICS DEVICES DIVISION ]
