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HD64F3337YF16 参数 Datasheet PDF下载

HD64F3337YF16图片预览
型号: HD64F3337YF16
PDF下载: 下载PDF文件 查看货源
内容描述: 单片机 [Single-Chip Microcomputer]
分类和应用: 微控制器和处理器外围集成电路
文件页数/大小: 747 页 / 2993 K
品牌: RENESAS [ RENESAS TECHNOLOGY CORP ]
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CMP.B  
BEQ  
BRA  
#H'32,  
NGEND  
PRGMS  
R6L  
; Program-verify executed 50 times?  
; If program-verify executed 50 times, branch to NGEND  
; Program again  
PVOK:  
BCLR  
MOV.B  
MOV.B  
#2,  
#H'00,  
R6L,  
@FLMCR:8  
;
Clear PV bit  
R6L  
;
@EBR*:8  
;
Clear EBR*  
One byte programmed  
Programming error  
NGEND:  
19.4.4  
Erase Mode  
To erase the flash memory, follow the erasing algorithm shown in figure 19.11. This erasing  
algorithm can erase data without subjecting the device to voltage stress or impairing the reliability  
of programmed data.  
To erase flash memory, before starting to erase, first place all memory data in all blocks to be  
erased in the programmed state (program all memory data to H'00). If all memory data is not in the  
programmed state, follow the sequence described later (figure 18-17) to program the memory data  
to zero. Select the flash memory areas to be erased with erase block registers 1 and 2 (EBR1 and  
EBR2). Next set the E bit in FLMCR, selecting erase mode. The erase time is the time during  
which the E bit is set. To prevent overerasing, use a software timer to divide the erase time into  
repeated 10 ms intervals, and perform erase operations a maximum of 3000 times so that the total  
erase time does not exceed 30 seconds. Overerasing, due to program runaway for example, can  
give memory cells a negative threshold voltage and cause them to operate incorrectly. Before  
selecting erase mode, set up the watchdog timer so as to prevent overerasing.  
19.4.5  
Erase-Verify Mode  
In erase-verify mode, after data has been erased, it is read to check that it has been erased  
correctly. After the erase time has elapsed, exit erase mode (clear the E bit to 0) and select erase-  
verify mode (set the EV bit to 1). Before reading data in erase-verify mode, write H'FF dummy  
data to the address to be read. This dummy write applies an erase-verify voltage to the memory  
cells at the latched address. If the flash memory is read in this state, the data at the latched address  
will be read. After the dummy write, wait 2 µs or more before reading. When performing the  
initial dummy write, wait 4 µs or more after selecting erase-verify mode. If the read data has been  
successfully erased, perform an erase-verify (dummy write, wait 2 µs or more, then read) for the  
next address. If the read data has not been erased, select erase mode again and repeat the same  
erase and erase-verify sequence through the last address. Do not repeat the erase and erase-verify  
sequence more than 3000 times, however.  
396  
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