TG-201902141228EP
2.3 Cardboard Box
深圳市瑞丰光电子股份有限公司
SHENZHEN REFOND OPTOELECTRONICS CO.LTO.
Fig.2-4 Cardboard Box
2.4 Reliability Test Items And Conditions
Table 2-3 Reliability Test Items And Conditions
Test Items
Ref.Standard
Test Condition
Time
Quantity
Ac/Re
/
-40 15min
↑↓10sec
Thermal Shock
JESD22-A106
100 cycle
10pcs.
0/1
100 15min
High Temperature Storage
Low Temperature Storage
JESD22-A103
JESD22-A119
1000hrs.
1000hrs.
10pcs.
10pcs.
0/1
0/1
Temp:100
Temp:-40
Tc=65
Life Test
JESD22-A108
1000hrs.
10pcs.
0/1
Ta=25
IF=120mA
Tel: +86-755-66839118 Fax:+86-755-66839300 E-mail:sales@refond.com Web: www.refond.com
REFOND:WI-E-045 A/3 REV:E/0
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