RELEASED
PM73123 AAL1GATOR-8
DATASHEET
PMC-2000097
ISSUE 2
8 LINK CES/DBCES AAL1 SAR
STCTEST
The single transport chain instruction is used to test out the TAP controller and
the boundary scan register during production test. When this instruction is the
current instruction, the boundary scan register is connected between TDI and
TDO. During the Capture-DR state, the device identification code is loaded into
the boundary scan register. The code can then be shifted out output, TDO using
the Shift-DR state.
Boundary Scan Cells
In the following diagrams, CLOCK-DR is equal to TCK when the current
controller state is SHIFT-DR or CAPTURE-DR, and unchanging otherwise. The
multiplexer in the center of the diagram selects one of four inputs, depending on
the status of select lines G1 and G2. The ID Code bit is as listed in the Boundary
Scan Register table in the JTAG Test Port section 11.2.
Figure 79 Input Observation Cell (IN_CELL)
IDCODE
Scan Chain Out
INPUT
to internal
Input
Pad
logic
G1
G2
SHIFT-DR
1 2
1 2
1 2
1 2
D
MUX
C
I.D. Code bit
CLOCK-DR
Scan Chain In
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