PixArt Imaging Inc.
ADNS-7530 Integrated Molded Lead-Frame DIP Sensor
Self_Test
Address: 0x10
Access: Write
Reset Value: NA
Bit
7
6
5
4
3
2
1
0
Field
Reserved
Reserved
Reserved
Reserved
Reserved
Reserved
Reserved
TESTEN
Data Type: Bit field
USAGE : Before performing system self test, reset the chip. Then, set the TESTEN bit in register 0x10 to start the system
self test. The test takes 250ms. During this time, do not write or read through the SPI port. Results are available in the
CRC0-3 registers. After self-test, reset the chip again to start normal operation.
Field Name
Description
TESTEN
Enable System Self Test
0 = Disabled
1 = Enable
Reserved
Address: 0x11
Configuration2_bits
Address: 0x12
Access: Read/Write
Reset Value: 0x26
Bit
7
6
5
4
3
2
1
0
Field
0
RES1
RES0
Reserved
AWAKE
RUN_Rate2 RUN_Rate1 RUN_Rate0
Data Type: Bit field
USAGE: Register 0x12 allows the user to change the configuration of the sensor. The RES bit allows selection between
400, 800, 1200 and 1600 cpi resolution.
Field Name
Description
RES[1:0]
Sets resolution
00 = 400
01 = 800
10 = 1200
11 = 1600
AWAKE
0 = Normal operation with REST mode enable.
1 = Force Awake
RUN_Rate[2:0]
000 = 2ms
001 = 3ms
010 = 4ms
011 = 5ms
100 = 6ms
101 = 7ms
110 = 8ms
Above timing calculated base on 25MHz system clock,
they may change after actual measurement.
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PixArt Imaging Inc.
E-mail: fae_service@pixart.com.tw
28
PIXART [ PIXART IMAGING INC. ]
