PRTR5V0U2X
NXP Semiconductors
Ultra low capacitance double rail-to-rail ESD protection diode
ESD TESTER
4 GHz DIGITAL
OSCILLOSCOPE
RG 223/U
50 Ω coax
R
Z
450 Ω
10×
ATTENUATOR
C
50 Ω
Z
DUT
Device
Under
Test
IEC 61000-4-2 network
= 150 pF; R = 330 Ω
C
Z
Z
vertical scale = 200 V/div
horizontal scale = 50 ns/div
vertical scale = 10 V/div
horizontal scale = 50 ns/div
GND
GND
unclamped +1 kV ESD voltage waveform
(IEC 61000-4-2 network)
clamped +1 kV ESD voltage waveform
(IEC 61000-4-2 network)
vertical scale = 10 V/div
horizontal scale = 50 ns/div
GND
GND
vertical scale = 200 V/div
horizontal scale = 50 ns/div
unclamped −1 kV ESD voltage waveform
(IEC 61000-4-2 network)
clamped −1 kV ESD voltage waveform
(IEC 61000-4-2 network)
006aab112
Fig 4. ESD clamping test setup and waveforms
PRTR5V0U2X_2
© NXP B.V. 2008. All rights reserved.
Product data sheet
Rev. 02 — 14 January 2008
5 of 11
NXP [ NXP ]
