KMA220
NXP Semiconductors
Dual channel programmable angle sensor
14. Electromagnetic compatibility
EMC is verified in an independent and certified test laboratory.
14.1 Emission (CISPR 25)
Tests according to CISPR 25 were fulfilled.
14.1.1 Conducted radio disturbance
Test of the device according to CISPR 25, third edition (2008-03), Chapter 6.2.
Classification level: 5.
14.1.2 Radiated radio disturbance
Test of the device according to CISPR 25, third edition (2008-03), Chapter 6.4.
Classification level: 5 (without addition of 6 dB in FM band).
14.2 Radiated disturbances (ISO 11452-1 third edition (2005-02),
ISO 11452-2, ISO 11452-4 and ISO 11452-5)
The common understanding of the requested function is that an effect is tolerated as
described in Table 27 during the disturbance. The reachable values are setup-dependent
and differ from the final application.
Table 27. Failure condition for radiated disturbances
Parameter
Variation of output signal in analog value measured relative to the
output mode output at test start
Comment
Min
Max
Unit
-
0.9
%VDD
14.2.1 Absorber lined shielded enclosure
Tests according to ISO 11452-2, second edition (2004-11), were fulfilled.
Test level: 200 V/m; extended up to 4 GHz.
State: A.
14.2.2 Bulk-current injection
Tests according to ISO 11452-4, third edition (2005-04), were fulfilled.
Test level: 200 mA.
State: A.
14.2.3 Strip line
Tests according to ISO 11452-5, second edition (2002-04), were fulfilled.
Test level: 200 V/m; extended up to 1 GHz.
State: A.
KMA220
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© NXP B.V. 2012. All rights reserved.
Product data sheet
Rev. 1 — 24 May 2012
28 of 36
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