HEF4051B
NXP Semiconductors
8-channel analog multiplexer/demultiplexer
11.2 Additional dynamic parameters
Table 11. Additional dynamic characteristics
VSS = VEE = 0 V; Tamb = 25 C.
Symbol
Parameter
Conditions
VDD
Typ
0.25
0.04
0.04
13
Max
Unit
%
[1]
[1]
[1]
[1]
[1]
[1]
[1]
THD
total harmonic distortion
see Figure 17; RL = 10 k; CL = 15 pF; 5 V
channel ON; VI = 0.5VDD (p-p);
fi = 1 kHz
-
-
-
-
-
-
-
10 V
%
15 V
5 V
%
f(3dB)
3 dB frequency response see Figure 18; RL = 1 k; CL = 5 pF;
MHz
MHz
MHz
dB
channel ON; VI = 0.5VDD (p-p)
10 V
15 V
10 V
40
70
iso
isolation (OFF-state)
crosstalk voltage
crosstalk
see Figure 19; fi = 1 MHz; RL = 1 k;
CL = 5 pF; channel OFF;
VI = 0.5VDD (p-p)
50
Vct
digital inputs to switch; see Figure 20; 10 V
RL = 10 k; CL = 15 pF;
E or Sn = VDD (square-wave)
50
-
mV
dB
[1]
Xtalk
between switches; see Figure 21;
fi = 1 MHz; RL = 1 k;
10 V
50
-
VI = 0.5VDD (p-p)
[1] fi is biased at 0.5 VDD; VI = 0.5VDD (p-p).
Table 12. Dynamic power dissipation PD
PD can be calculated from the formulas shown; VEE = VSS = 0 V; tr = tf 20 ns; Tamb = 25 C.
Symbol
Parameter
VDD
5 V
Typical formula for PD (W)
PD = 1000 fi + (fo CL) VDD
PD = 5500 fi + (fo CL) VDD
where:
2
2
PD
dynamic power
dissipation
fi = input frequency in MHz;
fo = output frequency in MHz;
10 V
15 V
2
CL = output load capacitance in pF;
DD = supply voltage in V;
(CL fo) = sum of the outputs.
PD = 15000 fi + (fo CL) VDD
V
11.2.1 Test circuits
V
V
DD
DD
S1 to S3
S1 to S3
V
or V
V
or V
DD
DD
SS
SS
Z
E
Yn
Z
E
Yn
V
= V
V
= V
SS EE
SS
EE
V
V
SS
SS
R
L
C
L
R
L
C
L
D
dB
f
f
i
i
001aak516
001aak517
Fig 17. Test circuit for measuring total harmonic
distortion
Fig 18. Test circuit for measuring frequency response
HEF4051B
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© NXP B.V. 2011. All rights reserved.
Product data sheet
Rev. 10 — 17 November 2011
13 of 23
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