SURFACE MOUNT DEVICE LED
Part No. : L-C150TBZCT-AG
REV:B / 3
6.Reliability Test
Classification
Test Item
Test Condition
Reference Standard
Ta= Under Room Temperature As Per Data
Sheet Maximum Rating
MIL-STD-750D:1026 (1995)
MIL-STD-883D:1005 (1991)
JIS C 7021:B-1 (1982)
Operation Life
*Test Time= 1000HRS
(-24HRS,+72HRS)*@5mA.
High Temperature
High Humidity
Storage
IR-Reflow In-Board, 2 Times
Ta= 65 5 ,RH= 90 95%
*Test Time= 1000HRS 2HRS
MIL-STD-202F:103B(1980)
JIS C 7021:B-11(1982)
Endurance Test
High Temperature
Storage
Ta= 105 5
Test Time= 1000HRS (-24HRS,72HRS)
MIL-STD-883D:1008 (1991)
JIS C 7021:B-10 (1982)
Low Temperature
Storage
Ta= -55 5
*Test Time=1000HRS (-24HRS,72H RS)
JIS C 7021:B-12 (1982)
MIL-STD-202F:107D (1980)
MIL-STD-750D:1051(1995)
MIL-STD-883D:1010 (1991)
JIS C 7021:A-4(1982)
Temperature
Cycling
105 5
-55 5
10mins
10mins
100 Cycles
100 Cycles
IR-Reflow In-Board, 2 Times
MIL-STD-202F:107D(1980)
MIL-STD-750D:1051(1995)
MIL-STD-883D:1011 (1991)
Thermal
Shock
105 5
-55
5
10mins
10mins
Environmental
Test
MIL-STD-202F:210A(1980)
MIL-STD-750D:2031(1995)
JIS C 7021:A-1(1982)
Solder
Tsol= 260
5
Resistance
Dwell Time= 10 1sec
MIL-STD-202F:208D(1980)
MIL-STD-750D:2026(1995)
MIL-STD-883D:2003(1991)
IEC 68 Part 2-20
Tsol= 235
5
Immersion time 2 0.5 sec
Solder ability
Immersion rate 25 2.5 mm/sec
Coverage
95% of the dipped surface
JIS C 7021:A-2(1982)
7.Others:
The appearance and specifications of the product may be modified for improvement without notice.
DRAWING NO. : DS-72-03-0010
DATE : 2013-5-29
PAGE
14 of 17
PARA-FOR-068
PARALIGHT [ PARA LIGHT ELECTRONICS CO., LTD. ]
