MC74VHCT245A
TEST CIRCUITS
TEST POINT
TEST POINT
1 k
OUTPUT
CONNECT TO V
WHEN
.
PZL
CC
AND t
Ω
OUTPUT
TESTING t
PLZ
CONNECT TO GND WHEN
TESTING t AND t
DEVICE
UNDER
TEST
DEVICE
UNDER
TEST
.
PZH
PHZ
C *
C *
L
L
* Includes all probe and jig capacitance
* Includes all probe and jig capacitance
Figure 3.
Figure 4.
EXPANDED LOGIC DIAGRAM
2
3
4
5
6
7
8
9
A1
A2
A3
A4
A5
A6
A7
A8
18
17
B1
B2
16
15
B3
B4
14
13
12
11
B5
B6
B7
B8
1
DIR
19
OE
MOTOROLA
4
VHC Data – Advanced CMOS Logic
DL203 — Rev 1