KAI−04070
Table 9. OPERATION CONDITIONS FOR DEFECT TESTING AT 275C
Description
Condition
Notes
Operational Mode
One Output, Using VOUTa, Continuous Readout
HCCD Clock Frequency
Pixels per Line
20 MHz
2,140
Lines per Frame
Line Time
2,112
115 ms
242.9 ms
Frame Time
Photodiode Integration Time (PD_Tint)
Temperature
PD_Tint = Frame Time = 242.9 ms, No Electronic Shutter Used
27°C
Light Source
Continuous Red, Green and Blue LED Illumination
Nominal Operating Voltages and Timing
1
Operation
1. For monochrome sensor, only the green LED is used.
Table 10. DEFECT DEFINITIONS FOR TESTING AT 405C
Description
Definition
Standard Grade
Notes
Major Dark Field Defective Bright Pixel
Major Bright Field Defective Pixel
Cluster Defect
Defect ≥ 27 mV
40
40
8
1
1
2
−12% ≥ Defect ≥ 12%
A group of 2 to 10 contiguous major defective pixels,
but no more than 2 adjacent defect horizontally.
Column Defect
A group of more than 10 contiguous major defective
pixels along a single column.
0
2
1. For the color devices (KAI−04070−CBA and KAI−04070−PBA), a bright field defective pixel deviates by 12% with respect to pixels of the
same color.
2. Column and cluster defects are separated by no less than two (2) good pixels in any direction (excluding single pixel defects).
Defect Map
defects are not included in the defect map. All defective
pixels are reference to pixel 1, 1 in the defect maps. See
Figure 22 for the location of pixel 1, 1.
The defect map supplied with each sensor is based upon
testing at an ambient (27°C) temperature. Minor point
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