KAI−04070
DEFECT DEFINITIONS
Table 7. OPERATION CONDITIONS FOR DEFECT TESTING AT 405C
Description
Condition
Notes
Operational Mode
One Output, using VOUTa, Continuous Readout
HCCD Clock Frequency
Pixels per Line
20 MHz
2,140
Lines per Frame
Line Time
2,112
115.0 ms
242.9 ms
Frame Time
Photodiode Integration Time (PD_Tint)
Temperature
PD_Tint = Frame Time = 242.9 ms, No Electronic Shutter Used
40°C
Light Source
Continuous Red, Green and Blue LED Illumination
Nominal Operating Voltages and Timing
1
Operation
1. For monochrome sensor, only the green LED is used.
Table 8. DEFECT DEFINITIONS FOR TESTING AT 405C
Description
Definition
Standard Grade
Notes
Major Dark Field Defective Bright Pixel
Defect ≥ 83 mV
40
40
400
8
1
1
Major Bright Field Defective Pixel
Minor Dark Field Defective Bright Pixel
Cluster Defect
−12% ≥ Defect ≥ 12%
Defect ≥ 41 mV
A group of 2 to 10 contiguous major defective pixels,
but no more than 2 adjacent defect horizontally.
2
2
Column Defect
A group of more than 10 contiguous major defective
pixels along a single column.
0
1. For the color devices (KAI−04070−CBA and KAI−04070−PBA), a bright field defective pixel deviates by 12% with respect to pixels of the
same color.
2. Column and cluster defects are separated by no less than two (2) good pixels in any direction (excluding single pixel defects).
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