NXP Semiconductors
HEF4066B
Quad single-pole single-throw analog switch
V
I
negative
pulse
0V
t
W
90 %
V
M
10 %
t
f
t
r
t
r
t
f
90 %
V
M
10 %
t
W
V
M
V
M
V
I
positive
pulse
0V
V
DD
V
I
V
I
V
O
RL
S1
V
DD
G
RT
DUT
CL
open
V
SS
001aak674
Test data is given in
Definitions:
DUT = Device Under Test.
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
C
L
= Load capacitance including test jig and probe.
R
L
= Load resistance.
Fig 9.
Table 11.
V
DD
Test circuit for measuring switching times
Test data
Input
V
I
0 V or V
DD
t
r
, t
f
20
ns
Load
C
L
50 pF
R
L
10 k
S1 position
t
PHL
, t
PLH
V
SS
t
PZH
, t
PHZ
V
SS
t
PZL
, t
PLZ
V
DD
Supply voltage
5 V to 15 V
11.2 Additional dynamic parameters
Table 12. Additional dynamic characteristics
V
SS
= 0 V; T
amb
= 25
C.
Symbol
THD
Parameter
total harmonic distortion
Conditions
V
DD
Typ
0.25
0.04
0.04
50
Max
-
-
-
-
Unit
%
%
%
mV
see
R
L
= 10 k; C
L
= 15 pF; 5 V
channel ON; V
I
= 0.5V
DD
(p-p);
10 V
f
i
= 1 kHz
15 V
nE input to switch; see
R
L
= 10 k; C
L
= 15 pF;
nE = V
DD
(square-wave)
10 V
V
ct
crosstalk voltage
HEF4066B
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2011. All rights reserved.
Product data sheet
Rev. 7 — 16 November 2011
8 of 16
PHILIPS [ NXP SEMICONDUCTORS ]
