NXP Semiconductors
HEF4066B
Quad single-pole single-throw analog switch
V
DD
V
IH
1E
1Y or 1Z
CHANNEL
ON
1Z or 1Y
VI
RL
V
VO1
V
IL
nE
nY or nZ
CHANNEL
OFF
V
SS
001aak678
nZ or nY
RL
RL
V
VO2
20 log
10
(V
O2
/ V
O1
) or 20 log
10
(V
O1
/ V
O2
).
Fig 12. Test circuit for measuring crosstalk between switches
V
DD
nE
nY
nZ
V
SS
nE
nY
V
DD
V
IL
V
IH
nZ
V
SS
fi
RL
CL
dB
fi
RL
CL
dB
001aak679
001aak680
Adjust f
i
voltage to obtain 0 dBm level at input.
Adjust f
i
voltage to obtain 0 dBm level at output. Increase
f
i
frequency until dB meter reads
3
dB.
Fig 13. Test circuit for measuring isolation (OFF-state)
Fig 14. Test circuit for measuring frequency response
HEF4066B
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2011. All rights reserved.
Product data sheet
Rev. 7 — 16 November 2011
10 of 16
PHILIPS [ NXP SEMICONDUCTORS ]
