Philips Semiconductors
Product specification
2-input AND gate
74AHC1G08; 74AHCT1G08
Family 74AHCT1G
At recommended operating conditions; voltages are referenced to GND (ground = 0 V).
TEST CONDITIONS
SYMBOL
PARAMETER
OTHER
V
IH
V
IL
V
OH
HIGH-level input
voltage
LOW-level input
voltage
HIGH-level output V
I
= V
IH
or V
IL
;
voltage
I
O
=
−50 µA
V
I
= V
IH
or V
IL
;
I
O
=
−8.0
mA
V
OL
LOW-level output
voltage
V
I
= V
IH
or V
IL
;
I
O
= 50
µA
V
I
= V
IH
or V
IL
;
I
O
= 8.0 mA
I
LI
I
CC
∆I
CC
input leakage
current
quiescent supply
current
additional
quiescent supply
current per input
pin
input capacitance
V
I
= V
IH
or V
IL
V
CC
(V)
MIN.
−
−
4.5
−
0
−
−
−
−
25
−
0.8
−
−
0.1
0.36
0.1
1.0
1.35
T
amb
(°C)
−40
to +85
−
0.8
−
−
0.1
0.44
1.0
10
1.5
−40
to +125 UNIT
−
0.8
−
−
0.1
0.55
2.0
40
1.5
TYP. MAX. MIN. MAX. MIN. MAX.
2.0
−
4.4
3.8
−
−
−
−
−
2.0
−
4.4
3.70
−
−
−
−
−
V
V
V
V
V
V
µA
µA
mA
4.5 to 5.5 2.0
4.5 to 5.5
−
4.5
4.5
4.5
4.5
5.5
4.4
3.94
−
−
−
−
−
V
I
= V
CC
or GND; 5.5
I
O
= 0
V
I
= 3.4 V;
other inputs at
V
CC
or GND;
I
O
= 0
5.5
C
I
−
1.5
10
−
10
−
10
pF
2002 Jun 06
6
PHILIPS [ NXP SEMICONDUCTORS ]
