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GE28F320B3BC90 参数 Datasheet PDF下载

GE28F320B3BC90图片预览
型号: GE28F320B3BC90
PDF下载: 下载PDF文件 查看货源
内容描述: [Flash, 2MX16, 90ns, PBGA48, VFBGA-48]
分类和应用: 内存集成电路
文件页数/大小: 71 页 / 1152 K
品牌: NUMONYX [ NUMONYX B.V ]
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28F008/800B3, 28F016/160B3, 28F320B3, 28F640B3  
9.3  
Power Supply Decoupling  
Flash memory power-switching characteristics require careful device decoupling. System  
designers must consider the following three supply current issues:  
1. Standby current levels (I  
).  
CCS  
2. Read current levels (I  
).  
CCR  
3. Transient peaks produced by falling and rising edges of CE#.  
Transient current magnitudes depend on the device output capacitive and inductive loading.  
Two-line control and proper decoupling capacitor selection suppresses these transient voltage  
peaks. Each flash device must have a 0.1 µF ceramic capacitor connected between each V and  
CC  
GND, and between its V and GND. These high-frequency, inherently low-inductance capacitors  
PP  
must be placed as close as possible to the package leads.  
9.4  
Power Consumption  
Intel® flash memory devices use a tiered approach to power savings that can significantly reduce  
overall system power consumption. The Automatic Power Savings (APS) feature reduces power  
consumption when the flash memory device is selected but idle. If CE# is deasserted, the flash  
memory device enters its standby mode, where current consumption is even lower. The  
combination of these features can minimize memory power consumption, and therefore minimize  
overall system power consumption.  
9.4.1  
9.4.2  
9.4.3  
Active Power  
When CE# is at a logic-low level and RP# is at a logic-high level, the flash memory device is in the  
active mode. Refer to the DC Characteristic tables for I current values. Active power is the  
largest contributor to overall system power consumption. Minimizing the active current can  
profoundly affect system power consumption, especially for battery-operated devices.  
CC  
Automatic Power Savings (APS)  
Automatic Power Savings provides low-power operation during read mode. After data is read from  
the flash memory array and the address lines are quiescent, APS circuitry places the flash memory  
device in a mode where typical current is comparable to I  
state with outputs valid until a new location is read.  
. The flash memory stays in this static  
CCS  
Standby Power  
When CE# is at a logic-high level (V ) and the flash memory device is in read mode, the flash  
IH  
memory is in standby mode. This mode disables much of the device circuitry, and substantially  
reduces power consumption. Outputs are placed in a high-impedance state independent of the  
status of the OE# signal. If CE# transitions to a logic-high level during Erase or Program  
operations, the flash memory device continues to perform the operation and consume  
corresponding active power until the operation is completed.  
System engineers must analyze the breakdown of standby time versus active time and quantify the  
respective power consumption in each mode for their specific application. This approach provides  
a more accurate measure of application-specific power and energy requirements.  
Datasheet  
Intel® Advanced Boot Block Flash Memory (B3)  
Order Number: 290580, Revision: 020  
18 Aug 2005  
49