28F008/800B3, 28F016/160B3, 28F320B3, 28F640B3
8.4
AC I/O Test Conditions
Figure 12.
AC Input/Output Reference Waveform
VCCQ
Test Points
Input
VCCQ/2
VCCQ/2
Output
0V
Note: Input timing begins, and output timing ends, at VCCQ/2. Input rise and fall times (10% to 90%) < 5 ns.
Worst-case speed conditions are when VCC = VCCMin.
Figure 13.
Transient Equivalent Testing Load Circuit
VCCQ
R1
Device
Under Test
Out
CL
R2
Note: See Table 24 for component values.
Table 24.
Test Configuration Component Values for Worst Case Speed Conditions
Test Configuration
VCCQMin Standard Test
CL (pF)
R1 (kΩ)
R2 (kΩ)
50
25
25
Note: CL includes jig capacitance.
8.5
Device Capacitance
T = 25 °C, f = 1 MHz
A
Table 25.
Device Capacitance
Symbol
Parameter§
Typ
Max
Unit
Condition
CIN
COUT
Input Capacitance
Output Capacitance
6
8
8
pF
pF
VIN = 0.0 V
12
VOUT = 0.0 V
§Sampled, not 100% tested.
18 Aug 2005
46
Intel® Advanced Boot Block Flash Memory (B3)
Order Number: 290580, Revision: 020
Datasheet
NUMONYX [ NUMONYX B.V ]
