Absolute Maximum Ratings (Note 1)
Lead Temperature (Soldering, 10 sec)
ESD Rating (Note 7)
260˚C
1kV
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Operating Range
Junction Temp. Range (Note 5)
PVIN, AVIN, VDDQ to GND
Storage Temp. Range
−0.3V to +6V
−65˚C to +150˚C
150˚C
0˚C to +125˚C
2.2V to 5.5V
2.2V to AVIN
AVIN to GND
Junction Temperature
PVIN to GND
SO-8 Thermal Resistance (θJA
)
151˚C/W
LLP-16 Thermal Resistance (θJA
)
51˚C/W
Electrical Characteristics Specifications with standard typeface are for TJ = 25˚C and limits in boldface
type apply over the full Operating Temperature Range (TJ = 0˚C to +125˚C). Unless otherwise specified,
AVIN = PVIN = 2.5V, VDDQ = 2.5V (Note 6).
Symbol
VREF
Parameter
VREF Voltage
Conditions
Min
1.21
−15
−20
Typ
1.235
0
Max
1.26
15
Units
V
IREF_OUT = 0mA
VOSVTT
VTT Output Voltage Offset IOUT = 0A
(Note 2)
mV
20
∆VTT/VTT
Load Regulation
(Note 3)
IOUT = 0 to 1.5A
0.5
−0.5
5
%
IOUT = 0 to −1.5A
ZVREF
ZVDDQ
Iq
VREF Output Impedance
VDDQ Input Impedance
Quiescent Current
IREF = −5µA to +5µA
kΩ
kΩ
µA
100
250
IOUT = 0A
(Note 4)
400
Note 1: Absolute maximum ratings indicate limits beyond which damage to the device may occur. Operating range indicates conditions for which the device is
intended to be functional, but does not guarantee specific performance limits. For guaranteed specifications and test conditions see Electrical Characteristics. The
guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed
test conditions.
Note 2: V offset is the voltage measurement defined as V subtracted from V .
REF
TT
TT
Note 3: Load regulation is tested by using a 10ms current pulse and measuring V
Note 4: Quiescent current defined as the current flow into AVIN.
.
TT
Note 5: At elevated temperatures, devices must be derated based on thermal resistance. The device in the SO-8 package must be derated at θ = 151˚ C/W
JA
junction to ambient with no heat sink. The device in the LLP-16 must be derated at θ = 51˚ C/W junction to ambient.
JA
Note 6: Limits are 100% production tested at 25˚C. Limits over the operating temperature range are guaranteed through correlation using Statistical Quality Control
(SQC) methods. The limits are used to calculate National’s Average Outgoing Quality Level (AOQL).
Note 7: The human body model is a 100pF capacitor discharged through a 1.5kΩ resistor into each pin.
3
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