Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
b
b
DC Latchup Source Current: OE Pin
(Across Comm Operating Range) Other Pins
150 mA
500 mA
Over Voltage Latchup (I/O)
10V
b
b
a
65 C to 150 C
Storage Temperature
Note 1: Absolute maximum ratings are values beyond which the device may
be damaged or have its useful life impaired. Functional operation under
these conditions is not implied.
§
§
a
55 C to 125 C
Ambient Temperature under Bias
§
§
Junction Temperature under Bias
Ceramic
Plastic
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
b
b
a
55 C to 175 C
§
§
a
55 C to 150 C
§
§
Recommended Operating
Conditions
V
Pin Potential to
CC
Ground Pin
b
a
0.5V to 7.0V
Free Air Ambient Temperature
Military
Commercial
Supply Voltage
Military
Commercial
Minimum Input Edge Rate
Data Input
b
a
0.5V to 7.0V
Input Voltage (Note 2)
Input Current (Note 2)
b
a
55 C to 125 C
§
40 C to 85 C
§
§
b
a
30 mA to 5.0 mA
b a
§
Voltage Applied to Any Output
in the Disabled or
Power-Off State
a
a
a
4.5V to 5.5V
a
b
a
0.5V to 5.5V
4.5V to 5.5V
b
in the HIGH State
0.5V to V
CC
(DV/Dt)
50 mV/ns
20 mV/ns
Current Applied to Output
in LOW State (Max)
Enable Input
twice the rated I (mA)
OL
DC Electrical Characteristics
ABT373
Typ
Symbol
Parameter
Units
V
CC
Conditions
Min
Max
V
V
V
V
Input HIGH Voltage
2.0
V
V
V
Recognized HIGH Signal
Recognized LOW Signal
IH
Input LOW Voltage
0.8
IL
b
e b
18 mA
Input Clamp Diode Voltage
Output HIGH Voltage
1.2
Min
Min
I
CD
OH
IN
e b
e b
e b
54ABT/74ABT
54ABT
74ABT
2.5
2.0
2.0
I
I
I
3 mA
24 mA
32 mA
OH
OH
OH
V
V
e
e
V
OL
Output LOW Voltage
Input HIGH Current
54ABT
74ABT
0.55
0.55
I
I
48 mA
64 mA
OL
OL
Min
e
e
I
5
5
V
IN
V
IN
2.7V (Note 2)
V
IH
mA
mA
mA
Max
Max
Max
CC
e
I
I
Input HIGH Current Breakdown Test
Input LOW Current
7
V
IN
7.0V
BVI
IL
b
b
e
e
5
5
V
IN
V
IN
0.5V (Note 2)
0.0V
e
ID
V
ID
Input Leakage Test
I
All Other Pins Grounded
1.9 mA
4.75
V
0.0
b
e
e
e
e
e
e
e
I
I
I
I
I
I
I
I
Output Leakage Current
Output Leakage Current
Output Short-Circuit Current
Output High Leakage Current
Bus Drainage Test
50
mA
mA
0
0
5.5V
5.5V
V
V
V
V
V
2.7V; OE
0.5V; OE
0.0V
2.0V
2.0V
OZH
OZL
OS
OUT
OUT
OUT
OUT
OUT
b
b
50
b
b
275 mA
100
Max
50
mA
mA
mA
mA
Max
0.0
V
CC
CEX
ZZ
100
50
5.5V; All Others GND
Power Supply Current
Power Supply Current
Power Supply Current
Max
Max
All Outputs HIGH
All Outputs LOW
CCH
CCL
CCZ
30
e
OE
V
CC
50
mA
Max
All Others at V or GND
CC
2.1V
e
V
b
I
Additional I /Input
CC
Outputs Enabled
Outputs TRI-STATE
Outputs TRI-STATE
2.5
2.5
2.5
mA
mA
mA
V
I
CCT
CC
e
b
2.1V
2.1V
Enable Input V
Data Input V
V
I
CC
b
Max
e
V
I
CC
All Others at V or GND
CC
e
Outputs Open, LE
GND, (Note 1)
I
Dynamic I
(Note 2)
No Load
V
CC
CCD
CC
mA/
MHz
e
One Bit Toggling, 50% Duty Cycle
0.12
OE
Max
k
Note 1: For 8 bits toggling, I
0.8 mA/MHz.
CCD
Note 2: Guaranteed, but not tested.
3
NSC [ National Semiconductor ]
