Absolute Maximum Ratings (Note 2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Recommended Operating
Conditions
Case Temperature (TC)
Military
−55˚C to +125˚C
−5.7V to −4.2V
Storage Temperature (TSTG
)
−65˚C to +150˚C
Supply Voltage (VEE
)
Maximum Junction Temperature (TJ)
Ceramic
Note 2: Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
+175˚C
−7.0V to +0.5V
VEE to +0.5V
−50 mA
VEE Pin Potential to Ground Pin
Input Voltage (DC)
Note 3: ESD testing conforms to MIL-STD-883, Method 3015.
Output Current (DC Output HIGH)
ESD (Note 3)
≥2000V
Military Version
DC Electrical Characteristics
=
=
=
=
−55˚C to +125˚C
C
VEE −4.2V to −5.7V, VCC VCCA GND, T
Symbol
Parameter
Min
Max
Units
TC
Conditions
Notes
VOH
Output HIGH Voltage −1025 −870
mV
0˚C to
+125˚C
−55˚C
0˚C to
+125˚C
−55˚C
0˚C to
+125˚C
−55˚C
0˚C to
+125˚C
−55˚C
=
VIN VIH (Max) Loading with
−1085 −870
mV
mV
or VIL (Min) 50Ω to −2.0V
(Notes 4, 5, 6)
VOL
Output LOW Voltage
−1830 −1620
−1830 −1555
mV
mV
VOHC
Output HIGH Voltage −1035
=
VIN VIH (Min) Loading with
−1085
mV
mV
or VIL (Max) 50Ω to −2.0V
(Notes 4, 5, 6)
VOLC
Output LOW Voltage
−1610
−1555
mV
mV
VIH
VIL
IIL
Input HIGH Voltage
Input LOW Voltage
Input LOW Current
Input HIGH Current
−1165 −870
−1830 −1475
0.50
−55˚C to Guaranteed HIGH Signal
+125˚C for All Inputs
−55˚C to Guaranteed LOW Signal
+125˚C for All Inputs
−55˚C to VEE −4.2V
(Notes 4, 5, 6, 7)
(Notes 4, 5, 6, 7)
(Notes 4, 5, 6)
mV
µA
µA
µA
mA
=
=
VIN VIL (Min)
+125˚C
0˚C to
+125˚C
−55˚C
−55˚C
to
=
VEE −5.7V
IIH
240
=
VIN VIH(Max)
(Notes 4, 5, 6)
(Notes 4, 5, 6)
340
IEE
Power Supply Current
Inputs Open
=
VEE −4.2V to −4.8V
−185
−195
−70
−70
=
VEE −4.2V to −5.7V
+125˚C
Note 4: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stablize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 5: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 6: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 7: Guaranteed by applying specified input conditon and testing V /V
.
OH OL
5
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