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100336D 参数 Datasheet PDF下载

100336D图片预览
型号: 100336D
PDF下载: 下载PDF文件 查看货源
内容描述: 低功耗4级计数器/移位寄存器 [Low Power 4-Stage Counter/Shift Register]
分类和应用: 移位寄存器计数器逻辑集成电路
文件页数/大小: 16 页 / 322 K
品牌: NSC [ NATIONAL SEMICONDUCTOR ]
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Military Version
AC Characteristics
V
EE
= −4.2V to −5.7V, V
CC
= V
CCA
= GND
Symbol
f
shift
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
TLH
t
THL
t
s
Parameter
Shift Frequency
Propagation Delay
CP to Q
n
, Q
n
T
C
= −55˚C
Min
325
0.40
1.30
1.20
0.60
2.30
2.10
0.70
1.30
0.20
2.30
3.90
4.60
2.90
5.20
4.30
3.20
4.10
1.90
Max
T
C
= +25˚C
Min
325
0.50
1.70
1.50
0.80
2.70
2.20
1.00
1.50
0.20
2.20
3.80
4.60
2.80
5.20
4.10
3.20
4.20
1.80
Max
T
C
= +125˚
Min
325
0.40
1.70
1.60
0.90
2.90
2.40
1.30
1.70
0.20
2.50
4.20
5.20
3.20
5.90
4.70
4.10
4.90
2.00
Max
Units
MHz
ns
ns
ns
ns
ns
ns
ns
Conditions
Notes
(Note 11)
(Notes 8, 9, 10, 12)
Figures 2, 3
Figures 1, 3
Figures 1, 7, 8
Figures 1, 9
Figures 1, 4
Propagation Delay
CP to TC (Shift)
Propagation Delay
CP to TC (Count)
Propagation Delay
MR to Q
n
, Q
n
(Notes 8, 9, 10, 12)
(Notes 8, 9, 10, 12)
Propagation Delay
MR to TC (Count)
Propagation Delay
MR to TC (Shift)
Propagation Delay
D
0
/CET to TC
Propagation Delay
S
n
to TC
Transition Time
20% to 80%, 80% to
20%
Setup Time
D
3
P
n
D
0
/CET
CEP
S
n
MR (Release Time)
Figures 1, 12
Figures 1, 10, 11
(Notes 8, 9, 10, 12)
Figures 1, 5
ns
ns
(Notes 8, 9, 10, 12)
Figures 1, 3
(Note 11)
1.40
1.70
1.80
1.80
3.30
2.60
0.90
1.00
0.70
0.60
0.00
1.60
2.00
1.40
1.70
1.80
1.80
3.30
2.60
0.90
1.00
0.70
0.60
0.00
1.60
2.00
1.40
1.70
1.80
1.80
3.30
2.60
0.90
1.00
0.70
0.60
0.00
1.60
2.00
ns
ns
ns
Figure 6
(Note 11)
t
h
Hold Time
D
3
P
n
D
0
/CET
CEP
S
n
Pulse Width
HIGH: CP
MR
Figure 6
(Note 11)
t
pw
(H)
Figures 3, 4
(Note 11)
Note 8:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold tempertures.
Note 9:
Screen tested 100% on each device at +25˚C temperature only, Subgroups A9.
Note 10:
Sample tested (Method 5005, Table I) on each manufactured lot at +25˚C, Subgroups A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11.
Note 11:
Not tested at +25˚C, +125˚C, and −55˚C temperature (design characterization data).
Note 12:
The propagation delay specified is for single output switching. Delays may vary up to 250 ps with multiple outputs switching.
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