5075 series
Modulation Characteristics
3
0
3
0
−3
−3
−6
−9
−6
−9
−12
−12
0
1
10
100
1000
0
1
10
100
1000
Frequency [kHz]
Frequency [kHz]
V
= 2.5V, f
= 27MHz, Ta = R.T.
V
= 3.3V, f = 27MHz, Ta = R.T.
OUT
DD
OUT
DD
Measurement circuit
VDD
XT
0.1µF
Crystal
XTN
VC
Q
Modulation
signal
R1
R2
Gain-phase
Analyzer
(HP 4194A)
C1
VSS
CLOUT
= 15pF
Demodulation
signal
Modulaiton
Analyzer
(HP 8901B)
C1 = 33µF, R1 = R2 = 1MΩ
VC modulation signal: 100Hz to 100kHz, 0 to V p-p
DD
Output Waveform
Measurement equipment: Oscilloscope; DSO80604B (Agilent)
Measurement circuit
V
V
= 3.3V
= 2.5V
DD
DD
VDD
XT
Crystal
XTN
Q
VC
CLOUT = 15pF
(Including probe
capacitance)
0.1µF
VSS
V
= 2.5V, 3.3V, f
C
= 27MHz, V = 0.5V
C
,
DD
OUT
= 15pF, Ta = R.T.
DD
LOUT
SEIKO NPC CORPORATION —13