5075 series
MEASUREMENT CIRCUITS
Measurement Circuit 1
Measurement Circuit 4
Measurement parameter: I
Measurement parameter: R
DD
VIN
I
DD
A
VDD
XT
IVIN
A
VDD
VDD
IVIN
XT
Crystal
RVIN =
XTN
VC
XTN
VC
Q
VSS
0.1µF
VSS
Measurement Circuit 5
Measurement parameter: C , Z
Measurement Circuit 2
VIN VIN
Measurement parameter: V , V
OH OL
VDD
XT
VDD
0.001µF
50Ω
Signal
Generator
XTN
VC
Q
XT
0.1µF
50Ω
Impedance
Analyzer
(HP 4194A)
XTN
VC
Q
VSS
V
OH
OL
0.1µF
VS
V
V
VSS
VC input signal: 100Hz to 10kHz, 0.1Vp-p
∆V
VOH
VS
VS
Measurement Circuit 6
Measurement parameter: fm
VOL
∆V
V
50 × I
adjusted such that ∆V =
OH
V adjusted such that ∆V =
S
50 × I .
OL
S
.
VDD
VSS
XT
0.1µF
Crystal
XT input signal: 1Vp-p, sine wave
XTN
VC
Q
Modulation
signal
R1
R2
Gain-phase
Analyzer
C1
Measurement Circuit 3
Measurement parameter: R , R
(HP 4194A)
CLOUT
= 15pF
VC1 VC2
Demodulation
signal
Modulaiton
Analyzer
(HP 8901B)
IXT
IXTN
A
A
VDD
VSS
VDD
VSS
C1 = 33µF, R1 = R2 = 1MΩ
VC modulation signal: 100Hz to 100kHz, 0 to V p-p
XT
XT
DD
XTN
VC
XTN
VC
Measurement Circuit 7
Measurement parameter: Duty, t , t
r
f
VDD
VDD
RVC1 =
RVC2 =
VDD
VSS
IXT
IXTN
XT
Crystal
XTN
VC
Q
C
LOUT = 15pF
0.1µF
(Including probe
capacitance)
SEIKO NPC CORPORATION —8
NPC [ NIPPON PRECISION CIRCUITS INC ]
