5026 series
5026ML× (3.0V operation)
V
DD
= 2.7 to 3.6V, V
SS
= 0V, Ta =
−40
to +85°C unless otherwise noted.
Rating
Parameter
HIGH-level output voltage
LOW-level output voltage
HIGH-level input voltage
LOW-level input voltage
Output leakage current
Symbol
V
OH
V
OL
V
IH
V
IL
I
Z
I
DD1
Current consumption
I
DD2
Measurement cct 3, load cct 1,
INHN = open, C
L
= 30pF
Measurement cct 3, INHN = LOW
Measurement cct 4
15
5026MLA
AC feedback resistance
R
f1
Design value.
A monitor pattern on a wafer is tested.
Measurement cct 5
Design value. A monitor pattern on a wafer is tested.
Design value. A monitor pattern on a wafer is tested.
5026MLA
C
G
Built-in capacitance
5026MLA
C
D
Design value.
A monitor pattern on a wafer is tested.
5026MLB
5026MLC
3.40
3.40
3.40
4
4
4
4.60
4.60
4.60
pF
pF
pF
Design value.
A monitor pattern on a wafer is tested.
5026MLB
5026MLC
5026MLB
5026MLC
DC feedback resistance
Oscillator amplifier output
resistance
AC feedback capacitance
R
f2
R
D
C
f
3.99
2.29
2.97
50
85
8.5
1.70
1.70
0.85
75
4.7
2.70
3.5
–
100
10
2
2
1
150
5.41
3.11
4.03
150
115
11.5
2.30
2.30
1.15
kΩ
kΩ
kΩ
kΩ
kΩ
Ω
pF
pF
pF
pF
Condition
min
Q: Measurement cct 1, V
DD
= 2.7V, I
OH
= 8mA
Q: Measurement cct 2, V
DD
= 2.7V, I
OL
= 8mA
INHN
INHN
Q: Measurement cct 2, INHN = LOW
Measurement cct 3, load cct 1,
INHN = open, C
L
= 15pF
V
OH
= V
DD
V
OL
= V
SS
f = 133MHz
f = 72MHz
f = 100MHz
f = 100MHz
Standby current
INHN pull-up resistance
I
ST
R
UP1
R
UP2
5026MLC
5026MLA
5026MLB
5026MLC
2.3
–
0.7V
DD
–
–
–
–
–
–
–
–
2
typ
2.4
0.3
–
–
–
–
20
15
20
20
–
4
max
–
0.4
–
0.3V
DD
10
10
40
30
40
40
5
8
V
V
V
V
µA
µA
mA
mA
mA
mA
µA
MΩ
Unit
SEIKO NPC CORPORATION —9
NPC [ NIPPON PRECISION CIRCUITS INC ]
