5026 series
5026ML× (2.5V operation)
= 2.25 to 2.75V, V = 0V, Ta = −40 to +85°C unless otherwise noted.
V
DD
SS
Rating
Parameter
Symbol
Condition
Unit
min
1.65
–
typ
1.95
0.3
–
max
–
HIGH-level output voltage
LOW-level output voltage
HIGH-level input voltage
LOW-level input voltage
V
Q: Measurement cct 1, V = 2.25V, I = 8mA
DD OH
V
V
OH
V
Q: Measurement cct 2, V = 2.25V, I = 8mA
DD OL
0.4
–
OL
V
INHN
INHN
0.7V
V
IH
DD
V
–
–
–
–
0.3V
V
IL
DD
V
V
= V
= V
–
10
10
ꢀA
ꢀA
OH
DD
Output leakage current
I
Q: Measurement cct 2, INHN = LOW
Measurement cct 3, load cct 1,
INHN = open, C = 15pF
Z
–
OL
SS
I
f = 133MHz 5026MLC
–
15
30
mA
DD1
L
f = 72MHz 5026MLA
–
–
11
15
15
–
22
30
mA
mA
mA
ꢀA
Current consumption
Measurement cct 3, load cct 1,
INHN = open, C = 30pF
I
f = 100MHz 5026MLB
f = 100MHz 5026MLC
DD2
L
–
30
Standby current
I
Measurement cct 3, INHN = LOW
Measurement cct 4
–
3
ST
R
2
6
12
MΩ
kΩ
kΩ
kΩ
kΩ
kΩ
UP1
INHN pull-up resistance
R
20
3.99
2.29
2.97
50
100
4.7
2.70
3.5
–
200
5.41
3.11
4.03
150
UP2
5026MLA
5026MLB
Design value.
A monitor pattern on a wafer is tested.
AC feedback resistance
DC feedback resistance
R
f1
5026MLC
R
Measurement cct 5
f2
Oscillator amplifier output
resistance
R
Design value. A monitor pattern on a wafer is tested.
Design value. A monitor pattern on a wafer is tested.
85
100
115
Ω
D
AC feedback capacitance
C
8.5
10
2
11.5
2.30
2.30
1.15
4.60
4.60
4.60
pF
pF
pF
pF
pF
pF
pF
f
5026MLA
1.70
1.70
0.85
3.40
3.40
3.40
Design value.
A monitor pattern on a wafer is tested.
C
5026MLB
5026MLC
5026MLA
5026MLB
5026MLC
2
G
1
Built-in capacitance
4
Design value.
A monitor pattern on a wafer is tested.
C
4
D
4
SEIKO NPC CORPORATION —8
NPC [ NIPPON PRECISION CIRCUITS INC ]
