CF5015 series
3V operation (CF5015BL×)
= 2.7 to 3.6V, V = 0V, Ta = −40 to +85°C unless otherwise noted.
V
DD
SS
Rating
typ
2.4
0.ꢀ
–
Parameter
Symbol
Condition
Unit
min
2.1
max
–
HIGH-level output voltage
LOW-level output voltage
HIGH-level input voltage
LOW-level input voltage
V
Q: Measurement cct 1, V = 2.7V, I = 4mA
DD OH
V
V
OH
V
Q: Measurement cct 1, V = 2.7V, I = 4mA
DD OL
–
0.4
–
OL
V
INHN
INHN
0.7V
V
IH
DD
V
–
–
–
0.ꢀV
V
IL
DD
V
V
= V
= V
–
10
10
11
6
ꢁA
ꢁA
mA
mA
mA
mA
mA
ꢁA
MΩ
kΩ
kΩ
pF
pF
OH
DD
Output leakage current
I
Q: Measurement cct 2, INHN = LOW
Z
–
–
OL
SS
CF5015BL1
CF5015BL2
CF5015BLꢀ
CF5015BL4
CF5015BL5
–
5.5
ꢀ
–
Measurement cct ꢀ, load cct 1,
INHN = open, C = 15pF, f = 60MHz
Current consumption
I
–
2
4
DD
L
–
1.5
1
ꢀ
–
2
Standby current
I
Measurement cct ꢀ, INHN = LOW
Measurement cct 4
–
–
5
ST
R
1
4
10
200
600
4.6
9.2
UP1
INHN pull-up resistance
Feedback resistance
Built-in capacitance
R
20
100
ꢀ.4
6.8
100
ꢀ00
4
UP2
R
Measurement cct 5
f
C
G
Design value. A monitor pattern on a wafer is tested.
C
8
D
5V operation (CF5015BL×)
= 4.5 to 5.5V, V = 0V, Ta = −40 to +85°C unless otherwise noted.
V
DD
SS
Rating
typ
4.2
0.ꢀ
–
Parameter
Symbol
Condition
Unit
min
ꢀ.9
max
–
HIGH-level output voltage
LOW-level output voltage
HIGH-level input voltage
LOW-level input voltage
V
Q: Measurement cct 1, V = 4.5V, I = 8mA
DD OH
V
V
OH
V
Q: Measurement cct 1, V = 4.5V, I = 8mA
DD OL
–
0.4
–
OL
V
INHN
INHN
0.7V
V
IH
DD
V
–
–
–
0.ꢀV
V
IL
DD
V
V
= V
= V
–
10
10
ꢀ0
19
1ꢀ
10
8
ꢁA
ꢁA
mA
mA
mA
mA
mA
ꢁA
MΩ
kΩ
kΩ
pF
pF
OH
DD
Output leakage current
I
Q: Measurement cct 2, INHN = LOW
Z
–
–
OL
SS
CF5015BL1
CF5015BL2
CF5015BLꢀ
CF5015BL4
CF5015BL5
–
15
9.5
6.5
5
–
Measurement cct ꢀ, load cct 1,
INHN = open, C = ꢀ0pF, f = 60MHz
Current consumption
I
–
DD
L
–
–
4
Standby current
I
Measurement cct ꢀ, INHN = LOW
Measurement cct 4
–
–
10
8
ST
R
0.5
10
100
ꢀ.4
6.8
2
UP1
INHN pull-up resistance
Feedback resistance
Built-in capacitance
R
50
ꢀ00
4
150
600
4.6
9.2
UP2
R
Measurement cct 5
f
C
G
Design value. A monitor pattern on a wafer is tested.
C
8
D
SEIKO NPC CORPORATION —5
NPC [ NIPPON PRECISION CIRCUITS INC ]
