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NFM31HK223R1H3 参数 Datasheet PDF下载

NFM31HK223R1H3图片预览
型号: NFM31HK223R1H3
PDF下载: 下载PDF文件 查看货源
内容描述: [This product specification is applied to Chip EMIFIL]
分类和应用:
文件页数/大小: 11 页 / 542 K
品牌: MURATA [ muRata ]
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AEC-Q200 Murata Standard Specification and Test Methods  
Electrical Performance  
No  
1
Item  
Capacitance  
(Cap.)  
Specification  
Shown in Rated value.  
Test Method  
Frequency: 1±0.1kHz  
Voltage : 1±0.2V(rms)  
Voltage : Rated Voltage  
Time : 2 minutes max.  
2
Insulation  
Resistance(I.R.)  
3
4
DC Resistance  
Measured with 100mA max.  
Withstanding Voltage  
Products shall not be damaged.  
Shown in Rated value.  
Test Voltage : Rated Voltage x 300%  
Time : 1 to 5 s  
Charge Current : 50 mA max.  
Operating Temperature  
Storage Temperature  
5
6
Self-temperature rise is not included  
Standard Testing Condition  
< Unless otherwise specified >  
< In case of doubt >  
Temperature : Ordinary Temp. / 15 °C to 35 °C  
Temperature: 20 °C ± 2 °C  
Humidity: Ordinary Humidity / 25 %(RH) to 85 %(RH)  
Humidity: 60 %(RH) to 70 %(RH)  
Atmospheric pressure: 86 kPa to 106 kPa  
JEMCPS-02916  
2
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