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GCD216R71H222MA01# 参数 Datasheet PDF下载

GCD216R71H222MA01#图片预览
型号: GCD216R71H222MA01#
PDF下载: 下载PDF文件 查看货源
内容描述: [汽车[动力总成 / 安全设备],汽车[信息娱乐 / 舒适设备],植入式以外的医疗器械设备 [GHTF A/B/C]]
分类和应用: 医疗医疗器械
文件页数/大小: 28 页 / 746 K
品牌: MURATA [ muRata ]
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AEC-Q200 Murata Standard Specification and Test Methods  
No  
AEC-Q200 Test Item  
Specification.  
AEC-Q200 Test Method  
Pre-and Post-Stress  
Electrical Test  
1
2
-
High Temperature  
Exposure (Storage)  
The measured and observed characteristics should satisfy Solder the capacitor on the test board (glass epoxy board).  
the specifications in the following table.  
Set the capacitor for 1000±12h at 150±3.  
Appearance No marking defects  
Set for 24±2h at room temperature, then measure.  
Capacitance R7 : Within ±10.0%  
Change  
D.F.  
R7 : 0.03 max.  
I.R.  
More than 10,000MΩ or 500ΩF  
(Whichever is smaller)  
3
Temperature Cycling  
The measured and observed characteristics should satisfy  
the specifications in the following table.  
Solder the capacitor on the test board (glass epoxy board).  
Perform cycle test according to the four heat treatments listed  
in the following table. Set for 24±2 hours at room temperature,  
then measure.  
Appearance No marking defects  
Capacitance R7 : Within ±10.0%  
Change  
Cycles  
Step  
Time(min)  
D.F.  
I.R.  
R7 : 0.03 max.  
1000  
-55+0/-3(for R7)  
Room  
1
2
3
4
15±3  
1
15±3  
1
More than 10,000MΩ or 500ΩF  
125+3/-0(for R7)  
Room  
(Whichever is smaller)  
Initial measurement for high dielectric constant type  
Perform a heat treatment at 150+0/-10 for 1h and then set  
for 24±2h at room temperature.  
Perform the initial measurement.  
4
5
Destructive  
No defects or abnormalities  
Per EIA-469.  
Physical Analysis  
Moisture Resistance  
The measured and observed characteristics should satisfy  
the specifications in the following table.  
Solder the capacitor on the test board (glass epoxy board).  
Apply the 24h heat (25 to 65) and humidity (80 to 98%)  
treatment shown below, 10 consecutive times.  
Set for 24±2h at room temperature, then measure.  
Appearance No marking defects  
Capacitance R7 : Within ±12.5%  
Change  
Humidity  
8098%  
Humidity  
8098%  
Temperature  
Humidity  
9098%  
Humidity  
9098%  
Humidity  
9098%  
()  
70  
65  
60  
55  
50  
45  
40  
35  
30  
25  
20  
15  
10  
5
D.F.  
I.R.  
R7 : 0.03 max.  
More than 10,000MΩ or 500ΩF  
+10  
2 ℃  
(Whichever is smaller)  
-
Initial measuremt  
0
-5  
-10  
One cycle 24hours  
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16 17 18 19 20 21 22 23 24  
Hours  
6
The measured and observed characteristics should satisfy  
the specifications in the following table.  
Biased Humidity  
Solder the capacitor on the test board (glass epoxy board).  
Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8kΩ resister)  
at 85±3and 80 to 85% humidity for 1000±12h.  
Remove and set for 24±2h at room temperature, then measure.  
The charge/discharge current is less than 50mA.  
Appearance No marking defects  
Capacitance R7 : Within ±12.5%  
Change  
D.F.  
R7 : 0.035 max.  
I.R.  
More than 1,000MΩ or 50ΩF  
(Whichever is smaller)  
JEMCGS-00806C  
2
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