■ Specifications and Test Methods
No Item
Specification
Test Method(Ref. Standard:JIS C 5101, IEC60384）
Appearance
Capacitance Change
Q or D.F.
No defects or abnormalities.
Within +/-0.3pF
Within the specified initial value.
More than 3000MΩ
Mounting method
Cycles
Temperature Cycling
Solder the capacitor on the test substrate
5cycles
14 Temperature Sudden
Change
I.R.
Voltage proof
No defects or abnormalities.
Post-treatment
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.
Appearance
Capacitance Change
Q or D.F.
No defects or abnormalities.
Within +/-0.3pF
Q≧275+5/2C C:Nominal Capacitance(pF)
More than 3000MΩ
Mounting method
Pre-test
Solder the capacitor on the test substrate
Before this test, the test shown in the following is performed.
・Adhesive Strength of Termination(apply force : 5N)
・Substrate Bending test
15 High Temperature High
Humidity (Steady)
I.R.
Voltage proof
No defects or abnormalities.
Test Temperature
Test Humidity
Test Time
40+/-2℃
90%RH to 95%RH
500+24/-0h
Test Voltage
Rated Voltage
Charge/discharge current 50mA max.
Post-treatment
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.
Appearance
Capacitance Change
Q or D.F.
No defects or abnormalities.
Within +/-0.3pF
Q≧275+5/2C C:Nominal Capacitance(pF)
More than 3000MΩ
Mounting method
Pre-test
Solder the capacitor on the test substrate
Before this test, the test shown in the following is performed.
・Adhesive Strength of Termination(apply force : 5N)
・Substrate Bending test
16 Durability
I.R.
Voltage proof
No defects or abnormalities.
・Impulse voltage (Applied Voltage:5kVo-p, Applied Times:3 times)
125+2/-0℃
50%RH max.
Test Temperature
Test Humidity
Test Time
1000+48/-0h
Test Voltage
AC425Vrms (except that once each hour the voltage is
increased to AC1000Vrms for 0.1second.)
Charge/discharge current 50mA max.
Post-treatment
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.
GA342A1XGF120JW31-B0B
4
MURATA [ muRata ]
