■ Specifications and Test Methods
No Item
1 Appearance
Specification
Test Method(Ref. Standard:JIS C 5101, IEC60384）
No defects or abnormalities.
Shown in Dimension.
Visual inspection
Using Measuring instrument of dimension.
2 Dimension
No defects or abnormalities.
Measurement Point
Test Voltage
Applied Time
Between the terminations
AC2000Vrms
60+/-1s
3 Voltage proof
Charge/discharge current 50mA max.
No self healing break downs or flash-overs have taken place in the capacitor.
Waveform
4 Impulse voltage
Applied Times
10 impulse of alternating polarity is subjected. (5 impulse for each polarity)
The interval between impulse is 60seconds.
2.5kVo-p
Applied Voltage
Measurement Temperature
Measurement Point
Measurement Voltage
Charging Time
More than 6000MΩ
Room Temperature
Between the terminations
DC500+/-50V
5 Insulation
Resistance(I.R.)
(Room Temperature)
60+/-5s
Charge/discharge current 50mA max.
Measurement Temperature
Shown in Rated value.
Room Temperature
6 Capacitance
Measurement Frequency 1.0+/-0.1MHz
Measurement Voltage
1.0+/-0.2Vrms
Measurement Temperature
Q≧400+20C C:Nominal Capacitance(pF)
Room Temperature
7 Q or Dissipation Factor
(D.F.)
Measurement Frequency 1.0+/-0.1MHz
Measurement Voltage
1.0+/-0.2Vrms
GA342A1XGF120JW31-B0B
2
MURATA [ muRata ]
