Freescale Semiconductor, Inc.
SEMICONDUCTOR TECHNICAL DATA
The MMA series of silicon capacitive, micromachined accelerometers
features signal conditioning, a 4–pole low pass filter and temperature
compensation. Zero–g offset full scale span and filter cut–off are factory set and
require no external devices. A full system self–test capability verifies system
functionality.
MMA3201D: X–Y AXIS SENSITIVITY
MICROMACHINED
ACCELEROMETER
±40g
Features
•
•
•
•
•
•
•
•
Integral Signal Conditioning
Linear Output
Ratiometric Performance
20
4th Order Bessel Filter Preserves Pulse Shape Integrity
Calibrated Self–test
11
1
Low Voltage Detect, Clock Monitor, and EPROM Parity Check Status
Transducer Hermetically Sealed at Wafer Level for Superior Reliability
Robust Design, High Shocks Survivability
10
20 LEAD SOIC
Typical Applications
CASE 475A
•
•
•
•
•
•
•
•
Vibration Monitoring and Recording
Impact Monitoring
Pin Assignment
Appliance Control
Mechanical Bearing Monitoring
Computer Hard Drive Protection
Computer Mouse and Joysticks
Virtual Reality Input Devices
Sports Diagnostic Devices and Systems
N/C
N/C
N/C
N/C
N/C
N/C
N/C
N/C
N/C
N/C
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
N/C
N/C
ST
X
OUT
STATUS
V
SS
N/C
Y
V
DD
AV
OUT
DD
SIMPLIFIED ACCELEROMETER FUNCTIONAL BLOCK DIAGRAM
AV
DD
V
DD
G–CELL
SENSOR
TEMP
COMP
X
OUT
INTEGRATOR
GAIN
FILTER
Y
OUT
ST
CONTROL LOGIC &
EPROM TRIM CIRCUITS
SELF–TEST
OSCILLATOR
CLOCK GEN.
V
SS
STATUS
Figure 1. Simplified Accelerometer Functional Block Diagram
REV 0
Motorola Sensor Device Data
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