PUMA2/67/77S4000/A-020/025/35
Issue4.3:December1999
SCREENING
Military Screening Procedure
MultiChip Screening Flow for high reliability product is in accordance with Mil-883 method 5004 .
MB MULTICHIP MODULE SCREENING FLOW
SCREEN
TEST METHOD
LEVEL
Visual and Mechanical
Internal visual
Temperature cycle
Constant acceleration
2010 Condition B or manufacturers equivalent
1010 Condition C (10 Cycles,-65oC to +150oC)
2001 Condition B (Y1 & Y2) (10,000g)
100%
100%
100%
Burn-In
Pre-Burn-in electrical
Burn-in
Per applicable device specifications at TA=+25oC
TA=+125oC,160hrs minimum.
100%
100%
Final Electrical Tests
Per applicable Device Specification
a) @ TA=+25oC and power supply extremes
b) @ temperature and power supply extremes
Static (DC)
100%
100%
Functional
a) @ TA=+25oC and power supply extremes
b) @ temperature and power supply extremes
100%
100%
Switching (AC)
a) @ TA=+25oC and power supply extremes
b) @ temperature and power supply extremes
100%
100%
Percent Defective allowable (PDA)
Hermeticity
Calculated at post-burn-in at TA=+25oC
10%
1014
Fine
Gross
Condition A
Condition C
100%
100%
Quality Conformance
External Visual
Per applicable Device Specification
Sample
100%
2009 Per vendor or customer specification
9
MOSAIC [ MOSAIC ]
