DATA SHEET
HAL855
3.7. Magnetic Characteristics
at TJ = −40 °C to +170 °C, VDD = 4.5 V to 14 V, after programming and locking of the device,
at Recommended Operation Conditions if not otherwise specified in the column “Conditions”.
Typical Characteristics for TJ = 25 °C and VDD = 5 V.
Symbol
Parameter
Pin No.
Min.
−1
Typ.
Max.
1
Unit
mT
Conditions
B
Magnetic Offset
3
0
0
B = 0 mT, T = 25 °C
Offset
J
ΔB
Δα
NL
/ΔT
Magnetic Offset Change
−15
15
μT/K
B = 0 mT
Offset
due to T
J
Error of Linear Temperature
Coefficient of Magnetic Sensitivity
−400
0
400
ppm/K TC and TCSQ suitable for the
application
Integral Non-Linearity of
Temperature Dependence of
Sensitivity
−
−
1
2
−
−
%
%
α < 2000 ppm/K
α >= 2000 ppm/K
SB(T)
TC and TCSQ suitable for the
application
B
Magnetic Hysteresis
−20
0
20
μT
Range = 30 mT, Filter = 500 Hz
Hysteresis
Definition of Sensitivity Errors over Temperature
Micronas specifies two sensitivity errors over
temperature:
A ideal Hall-effect device would not be affected by
temperature. Its temperature compensation would
allow to compensate for a linear temperature coeffi-
cient αIDEAL of a permanent magnet.
1. the error of the linear temperature coefficient α:
Δα = α – α IDEAL
SIDEAL = 1 + αIDEAL × (T – T0)
2. the maximum residual error over temperature
resulting from the least square fit, i.e., the integral
non-linearity of the temperature dependence of sen-
sitivity:
The temperature dependence of the sensitivity of a
real sensor is not ideally linear. Its linear temperature
coefficient α is determined by a linear least square fit.
NLSB(T) = maxT res(T)
SB = S0 × (1 + α × (T – T0) + res(T))
S0 and α are the fit parameters, res(T) the residual error.
Micronas
Nov. 26, 2008; DSH000149_003EN
25
MICRONAS [ MICRONAS ]
