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PF48F4000P0ZB 参数 Datasheet PDF下载

PF48F4000P0ZB图片预览
型号: PF48F4000P0ZB
PDF下载: 下载PDF文件 查看货源
内容描述: 美光并行NOR闪存的嵌入式存储器( P30-65nm ) [Micron Parallel NOR Flash Embedded Memory (P30-65nm)]
分类和应用: 闪存存储
文件页数/大小: 98 页 / 1366 K
品牌: MICRON [ MICRON TECHNOLOGY ]
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256Mb and 512Mb (256Mb/256Mb), P30-65nm  
Program Operations  
On the next write, a word count is written to the device at the buffer address. This tells  
the device how many data words will be written to the buffer, up to the maximum size  
of the buffer.  
On the next write, a device start address is given along with the first data to be written to  
the flash memory array. Subsequent writes provide additional device addresses and da-  
ta. All data addresses must lie within the start address plus the word count. Optimum  
programming performance and lower power usage are obtained by aligning the starting  
address at the beginning of a 512-word boundary (A[9:1] = 0x00 for Easy BGA and TSOP,  
A[8:0] for QUAD+ package; see Part Numbering Information). The maximum buffer size  
would be 256-word if the misaligned address range is crossing a 512-word boundary  
during programming.  
After the last data is written to the buffer, the BUFFERED PROGRAMMING CONFIRM  
command must be issued to the original block address. The device begins to program  
buffer contents to the array. If a command other than the BUFFERED PROGRAMMING  
CONFIRM command is written to the device, a command sequence error occurs and  
SR[7,5,4] are set. If an error occurs while writing to the array, the device stops program-  
ming, and SR[7,4] are set, indicating a programming failure.  
When buffered programming has completed, additional buffer writes can be initiated  
by issuing another BUFFERED PROGRAMMING SETUP command and repeating the  
buffered program sequence. Buffered programming may be performed with VPP = VPPL  
or VPPH (see Operating Conditions for limitations when operating the device with VPP  
VPPH).  
=
If an attempt is made to program past an erase-block boundary using the BUFFERED  
PROGRAM command, the device aborts the operation. This generates a command se-  
quence error, and SR[5,4] are set.  
If buffered programming is attempted while VPP is at or below VPPLK, SR[4,3] are set. If  
any errors are detected that have set status register bits, the status register should be  
cleared using the CLEAR STATUS REGISTER command.  
Buffered Enhanced Factory Programming (80h, D0h)  
Buffered enhanced factory programming (BEFP) speeds up multilevel cell (MLC) pro-  
gramming. The enhanced programming algorithm used in BEFP eliminates traditional  
programming elements that drive up overhead in device programmer systems.  
BEFP consists of three phases: setup, program/verify, and exit (see the BEFP Flowchart).  
It uses a write buffer to spread MLC program performance across 512 data words. Verifi-  
cation occurs in the same phase as programming to accurately program the cell to the  
correct bit state.  
A single two-cycle command sequence programs the entire block of data. This en-  
hancement eliminates three write cycles per buffer: two commands and the word count  
for each set of 512 data words. Host programmer bus cycles fill the device write buffer  
followed by a status check. SR0 indicates when data from the buffer has been program-  
med into sequential array locations.  
Following the buffer-to-flash array programming sequence, the device increments in-  
ternal addressing to automatically select the next 512-word array boundary. This aspect  
of BEFP saves host programming equipment the address bus setup overhead.  
PDF: 09005aef84566799  
p30_65nm_MLC_256Mb-512mb.pdf - Rev. C 12/13 EN  
Micron Technology, Inc. reserves the right to change products or specifications without notice.  
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© 2013 Micron Technology, Inc. All rights reserved.