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M29W256GH70N3E 参数 Datasheet PDF下载

M29W256GH70N3E图片预览
型号: M29W256GH70N3E
PDF下载: 下载PDF文件 查看货源
内容描述: [Parallel NOR Flash Embedded Memory]
分类和应用: 光电二极管内存集成电路
文件页数/大小: 76 页 / 992 K
品牌: MICRON [ MICRON TECHNOLOGY ]
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256Mb: 3V Embedded Parallel NOR Flash  
Write AC Characteristics  
Figure 20: WE#-Controlled Program AC Timing (8-Bit Mode)  
3rd Cycle 4th Cycle  
Data Polling  
PA  
READ Cycle  
t
t
WC  
WC  
AAAh  
t
PA  
A[MAX:0]/A-1  
CE#  
t
AS  
AH  
t
t
CH  
t
CE  
CS  
t
t
GHWL  
OE  
OE#  
t
t
WP  
WPH  
WE#  
t
t
DF  
OH  
t
WHWH1  
t
DS  
DQ[7:0]  
A0h  
DH  
PD  
DQ7#  
D
D
OUT  
OUT  
t
1. Only the third and fourth cycles of the PROGRAM command are represented. The PRO-  
GRAM command is followed by checking of the status register data polling bit and by a  
READ operation that outputs the data (DOUT) programmed by the previous PROGRAM  
command.  
Notes:  
2. PA is the address of the memory location to be programmed. PD is the data to be pro-  
grammed.  
3. DQ7 is the complement of the data bit being programmed to DQ7. (See Data Polling Bit  
[DQ7].)  
4. See the following tables for timing details: Read AC Characteristics, WE#-Controlled  
Write AC Characteristics, and CE#-Controlled Write AC Characteristics.  
PDF: 09005aef84bd3b68  
m29w_256mb.pdf - Rev. C 7/13 EN  
Micron Technology, Inc. reserves the right to change products or specifications without notice.  
64  
© 2013 Micron Technology, Inc. All rights reserved.  
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