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M29W256GH70N3E 参数 Datasheet PDF下载

M29W256GH70N3E图片预览
型号: M29W256GH70N3E
PDF下载: 下载PDF文件 查看货源
内容描述: [Parallel NOR Flash Embedded Memory]
分类和应用: 光电二极管内存集成电路
文件页数/大小: 76 页 / 992 K
品牌: MICRON [ MICRON TECHNOLOGY ]
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256Mb: 3V Embedded Parallel NOR Flash  
READ Operations  
8. For x8, A[MAX:5] address pins should remain unchanged while A[4:0] and A-1 pins are  
used to select a byte within the N + 1 byte page. For x16, A[MAX:5] address pins should  
remain unchanged while A[4:0] pins are used to select a word within the N + 1 word  
page.  
9. The following is content for address/data cycles 256 through 258: BAd (FE) - Data; BAd  
(FF) - Data; BAd (00) - 29.  
10. BLOCK ERASE address cycles can extend beyond six address/data cycles, depending on  
the number of blocks to erase.  
READ Operations  
READ/RESET Command  
The READ/RESET (F0h) command returns the device to read mode and resets the errors  
in the status register. One or three bus WRITE operations can be used to issue the  
READ/RESET command.  
To return the device to read mode, this command can be issued between bus WRITE  
cycles before the start of a PROGRAM or ERASE operation. If the READ/RESET com-  
mand is issued during the timeout of a BLOCK ERASE operation, the device requires up  
to 10μs to abort, during which time no valid data can be read.  
READ CFI Command  
The READ CFI (98h) command puts the device in read CFI mode and is valid only when  
the device is in read array or auto select mode. One bus WRITE cycle is required to issue  
the command.  
Once in read CFI mode, bus READ operations will output data from the CFI memory  
area. A READ/RESET command must be issued to return the device to the previous  
mode (read array or auto select ). A second READ/RESET command is required to put  
the device in read array mode from auto select mode.  
PDF: 09005aef84bd3b68  
m29w_256mb.pdf - Rev. C 7/13 EN  
Micron Technology, Inc. reserves the right to change products or specifications without notice.  
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© 2013 Micron Technology, Inc. All rights reserved.  
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