WE32K32-XXX
ABSOLUTE MAXIMUM RATINGS
TRUTH TABLE
Parameter
Symbol
TA
Unit
°C
°C
V
CS#
H
OE#
X
WE#
Mode
Standby
Read
Data I/O
High Z
Operating Temperature
Storage Temperature
-55 to +125
-65 to +150
-0.6 to + 6.25
-0.6 to +13.5
X
H
L
TSTG
VG
L
L
Data Out
Signal Voltage Relative to GND
Voltage on OE# and A9
L
H
Write
Data In
V
X
H
X
H
X
Out Disable
Write
High Z/Data Out
X
X
NOTE:
Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to
the device. This is a stress rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this specification is not implied.
Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
X
L
Inhibit
CAPACITANCE
TA = +25°C
RECOMMENDED OPERATING CONDITIONS
Parameter
Symbol
Conditions
VIN = 0 V, f = 1.0 MHz
Max Unit
Parameter
Supply Voltage
Symbol
VCC
VIH
Min
4.5
2.0
-0.3
-55
-40
Max
5.5
Unit
V
Address input capacitance
OE# capacitance
CAD
COE
50
pF
Input High Voltage
VCC + 0.3
+0.8
V
Input Low Voltage
VIL
V
WE# capacitance
CWE
CCS
CI/O
VIN = 0 V, f = 1.0 MHz
VIN = 0 V, f = 1.0 MHz
VI/O = 0 V, f = 1.0 MHz
50
25
40
pF
pF
pF
Operating Temp. (Mil.)
Operating Temp. (Ind.)
TA
+125
+85
°C
°C
CS1-4# capacitance
Data I/O capacitance
TA
This parameter is guaranteed by design but not tested.
DC CHARACTERISTICS
VCC = 5.0V, GND = 0V, -55°C ≤ TA ≤ +125°C
-80
-90
-120
-150
Parameter
Symbol
Conditions
Unit
Min Max Min Max Min Max Min Max
Input Leakage Current
Output Leakage Current
Operating Supply Current (x32)
Standby Current
ILI
VCC = 5.5, VIN = GND to VCC
10
10
10
10
10
10
10
10
μA
μA
mA
mA
V
ILOx32
ICCx32
ISB
CS# = VIH, OE# = VIH, VOUT = GND to VCC
CS# = VIL, OE# = VIH, f = 5MHz
CS# = VIH, OE# = VIH, f = 5MHz
IOL = 2.1mA, VCC = 4.5V
320
2.5
250
2.5
200
2.5
150
2.5
Output Low Voltage
VOL
0.45
0.45
0.45
0.45
Output High Voltage
VOH
IOH = -400μA, VCC = 4.5V
2.4
2.4
2.4
2.4
V
NOTE: DC test conditions: VIH = VCC -0.3V, VIL = 0.3V
AC TEST CONDITIONS
FIGURE 3 – AC TEST CIRCUIT
Parameter
Typ
Unit
Input Pulse Levels
Input Rise and Fall
VIL = 0, VIH = 3.0
V
ns
V
5
IOL
Input and Output Reference Level
Output Timing Reference Level
1.5
1.5
Current Source
V
Notes: VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75Ω.
VZ ≈ 1.5V
D.U.T.
(Bipolar Supply)
V
I
Z is typically the midpoint of VOH and VOL
OL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
.
Ceff = 50 pf
IOH
Current Source
Microsemi Corporation reserves the right to change products or specifications without notice.
August 2014 © 2014 Microsemi Corporation. All rights reserved.
Rev. 9
3
Microsemi Corporation • (602) 437-1520 • www.microsemi.com/pmgp