®
LY61L1024
128K X 8 BIT HIGH SPEED CMOS SRAM
Rev. 2.7
DC ELECTRICAL CHARACTERISTICS
SYMBOL
TEST CONDITION
MIN.
3.0
2.0
- 0.5
- 1
TYP. *4 MAX.
UNIT
PARAMETER
Supply Voltage
VCC
3.3
3.6
VCC+0.5
0.6
V
V
V
*1
Input High Voltage
Input Low Voltage
Input Leakage Current
Output Leakage
Current
VIH
VIL
-
-
-
*2
ILI
V
V
CC ≧ VIN ≧ VSS
CC ≧ VOUT ≧ VSS,
Output Disabled
1
A
µ
ILO
- 1
-
1
A
µ
Output High Voltage
Output Low Voltage
VOH IOH = -4mA
VOL IOL = 8mA
Cycle time = Min.
CE# = VIL and CE2 = VIH,
I/O = 0mA
2.2
-
-
75
70
65
55
-
V
V
mA
mA
mA
mA
-
-
-
-
-
0.4
120
100
90
-10
-12
-15
-18
Average Operating
Power supply Current
ICC
I
Others at VIL or VIH
80
CE# = VIH or CE2 = VIL
Others at VIL or VIH
CE# ≧VCC-0.2V
ISB
-
-
3
20
3
mA
mA
Normal
LL
0.6
Standby Power
Supply Current
≦
or CE2 0.2V
ISB1
CE# ≧VCC-0.2V
≦
-
1
30
A
µ
or CE2 0.2V
Others at 0.2V or VCC-0.2V
Notes:
1. VIH(max) = VCC + 3.0V for pulse width less than 10ns.
2. VIL(min) = VSS - 3.0V for pulse width less than 10ns.
3. Over/Undershoot specifications are characterized, not 100% tested.
4. Typical values are included for reference only and are not guaranteed or tested.
℃
Typical valued are measured at VCC = VCC(TYP.) and TA = 25
CAPACITANCE (TA = 25℃, f = 1.0MHz)
PARAMETER
Input Capacitance
Input/Output Capacitance
SYMBOL
CIN
MIN.
-
-
MAX
6
8
UNIT
pF
pF
CI/O
Note : These parameters are guaranteed by device characterization, but not production tested.
AC TEST CONDITIONS
Input Pulse Levels
0.2V to VCC - 0.2V
Input Rise and Fall Times
Input and Output Timing Reference Levels
Output Load
3ns
1.5V
CL = 30pF + 1TTL, IOH/IOL = -4mA/8mA
Lyontek Inc. reserves the rights to change the specifications and products without notice.
5F, No. 2, Industry E. Rd. IX, Science-Based Industrial Park, Hsinchu 300, Taiwan.
TEL: 886-3-6668838
FAX: 886-3-6668836
5
LYONTEK [ Lyontek Inc. ]
