ABSOLUTE MAXIMUM RATINGS
OPERATING RANGES
Storage Temperature . . . . . . . . . . . . . .-65°C to +150°C
Commercial (C) Devices
Ambient Temperature with
Power Applied . . . . . . . . . . . . . . . . . .-55°C to +125°C
Ambient Temperature (T )
A
Operating in Free Air . . . . . . . . . . . . . . . 0°C to +75°C
Supply Voltage with
Respect to Ground . . . . . . . . . . . . . . . -0.5 V to +7.0 V
Supply Voltage (V ) with
CC
Respect to Ground. . . . . . . . . . . . . +4.75 V to +5.25 V
DC Input Voltage . . . . . . . . . . . .-0.5 V to V + 1.0 V
CC
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
DC Output or I/O Pin Voltage . . .-0.5 V to V + 1.0 V
CC
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Latchup Current (T = 0°C to +75°C) . . . . . . . . 100 mA
A
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum
Ratings for extended periods may affect device reliability.
Programming conditions may vary.
DC CHARACTERISTICS OVER COMMERCIAL OPERATING RANGES
Parameter
Symbol
Parameter Description
Output HIGH Voltage
Test Conditions
Min
Max
Unit
V
V
I
= -3.2 mA, V = V or V V = Min
IN IH IL, CC
2.4
OH
OH
V
Output LOW Voltage
I
= 16 mA, V = V or V V = Min
0.4
V
OL
OL
IN IH
IL, CC
Guaranteed Input Logical HIGH
Voltage for all Inputs (Note 1)
V
Input HIGH Voltage
2.0
V
V
IH
Guaranteed Input Logical LOW
Voltage for all Inputs (Note 1)
V
Input LOW Voltage
0.8
IL
I
Input HIGH Leakage Current
Input LOW Leakage Current
V = V , V = Max (Note 2)
IN CC CC
10
µA
µA
IH
I
V = 0 V, V = Max (Note 2)
-100
IL
IN
CC
Off-State Output Leakage
Current HIGH
V
= V , V = Max,
OUT CC CC
I
10
µA
µA
mA
OZH
V = V or V (Note 2)
IN IL IH
V
= 0 V, V = Max,
CC
Off-State Output Leakage
Current LOW
OUT
I
-100
-130
OZL
V = V or V (Note 2)
IN IL IH
Output Short-Circuit
Current
I
V
= 0.5 V, V = Max (Note 3)
CC
-30
SC
OUT
I
(Static)
Supply Current
Supply Current
Outputs Open, (I
Outputs Open, (I
= 0 mA), V = Max
CC
125
140
mA
mA
CC
OUT
OUT
I
(Dynamic)
= 0 mA), V = Max, f = 25 MHz
CC
CC
Notes:
1. These are absolute values with respect to the device ground, and all overshoots due to system and tester noise are included.
2. I/O pin leakage is the worst case of I and I (or I and I ).
IL OZL IH OZH
3. Not more than one output should be tested at a time, and the duration of the short-circuit test should not exceed one second.
V
= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
OUT
8
PALCE22V10H-5 (Com’l)
LATTICE [ LATTICE SEMICONDUCTOR ]
