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PALCE22V10H-10PC/5 参数 Datasheet PDF下载

PALCE22V10H-10PC/5图片预览
型号: PALCE22V10H-10PC/5
PDF下载: 下载PDF文件 查看货源
内容描述: 24引脚EE CMOS (零功耗)多功能PAL器件 [24-Pin EE CMOS (Zero Power) Versatile PAL Device]
分类和应用: 可编程逻辑器件光电二极管输入元件时钟
文件页数/大小: 34 页 / 662 K
品牌: LATTICE [ LATTICE SEMICONDUCTOR ]
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ABSOLUTE MAXIMUM RATINGS  
OPERATING RANGES  
Storage Temperature . . . . . . . . . . . . . .-65°C to +150°C  
Commercial (C) Devices  
Ambient Temperature with  
Power Applied . . . . . . . . . . . . . . . . . .-55°C to +125°C  
Ambient Temperature (T )  
A
Operating in Free Air . . . . . . . . . . . . . . . 0°C to +75°C  
Supply Voltage with Respect  
to Ground . . . . . . . . . . . . . . . . . . . . . -0.5 V to +7.0 V  
Supply Voltage (V ) with  
CC  
Respect to Ground. . . . . . . . . . . . . +4.75 V to +5.25 V  
DC Input Voltage . . . . . . . . . . . .-0.5 V to V + 1.0 V  
CC  
Operating ranges define those limits between which the func-  
tionality of the device is guaranteed.  
DC Output or I/O Pin Voltage . . .-0.5 V to V + 1.0 V  
CC  
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V  
Latchup Current (T = 0°C to +75°C) . . . . . . . . 100 mA  
A
Stresses above those listed under Absolute Maximum Ratings  
may cause permanent device failure. Functionality at or above  
these limits is not implied. Exposure to Absolute Maximum  
Ratings for extended periods may affect device reliability.  
Programming conditions may vary.  
DC CHARACTERISTICS OVER COMMERCIAL OPERATING RANGES  
Symbol  
Parameter Description  
Test Conditions  
Min  
Max  
Unit  
V
V
Output HIGH Voltage  
I
= -3.2 mA, V = V or V V = Min  
IN IH IL, CC  
2.4  
OH  
OH  
V
Output LOW Voltage  
I
= 16 mA, V = V or V V = Min  
0.4  
V
OL  
OL  
IN IH  
IL, CC  
Guaranteed Input Logical HIGH  
Voltage for all Inputs (Note 1)  
V
Input HIGH Voltage  
Input LOW Voltage  
2.0  
V
V
IH  
Guaranteed Input Logical LOW  
Voltage for all Inputs (Note 1)  
V
0.8  
IL  
I
Input HIGH Leakage Current  
Input LOW Leakage Current  
V = V , V = Max (Note 2)  
IN CC CC  
10  
µA  
µA  
IH  
I
V = 0 V, V = Max (Note 2)  
-100  
IL  
IN  
CC  
Off-State Output Leakage  
Current HIGH  
I
V
= V , V = Max, V = V or V (Note 2)  
10  
µA  
µA  
mA  
OZH  
OUT CC CC  
IN IL IH  
Off-State Output Leakage  
Current LOW  
I
V
= 0 V, V = Max, V = V or V (Note 2)  
-100  
-130  
OZL  
OUT  
CC  
IN IL IH  
Output Short-Circuit  
Current  
V
= 0.5 V, VCC = Max  
OUT  
I
-30  
SC  
T = 25°C (Note 3)  
A
I
(Static)  
Supply Current  
Outputs Open, (I  
= 0 mA), V = Max  
CC  
115  
140  
mA  
mA  
CC  
OUT  
I
(Dynamic) Supply Current  
Outputs Open, (I = 0 mA), V = Max, f = 25 MHz  
OUT  
CC  
CC  
Notes:  
1. These are absolute values with respect to the device ground, and all overshoots due to system and tester noise are included.  
2. I/O pin leakage is the worst case of I and I (or I and I ).  
IL OZL IH OZH  
3. Not more than one output should be tested at a time. Duration of the short-circuit test should not exceed one second.  
V
= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.  
OUT  
10  
PALCE22V10H-7 (Coml)  
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