Specifications
GAL18V10
AC Switching Characteristics
Over Recommended Operating Conditions
COM
COM
TEST
PARAMETER
COND.
1
DESCRIPTION
Input or I/O to Combinatorial Output
Clock to Output Delay
Clock to Feedback Delay
Setup Time, Input or Feedback before Clock↑
Hold Time, Input or Feedback after Clock↑
Maximum Clock Frequency with
External Feedback, 1/(tsu +tco)
—
—
—
10
0
50
-15
MIN. MAX.
15
10
7
—
—
—
-20
MIN. MAX.
—
—
—
12
0
41.6
20
12
10
—
—
—
UNITS
ns
ns
ns
ns
ns
MHz
t
pd
t
co
t
cf
2
t
su
t
h
A
A
—
—
—
A
f
max
3
A
A
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
Maximum Clock Frequency with
No Feedback
58.8
62.5
—
—
45.4
62.5
—
—
MHz
MHz
t
wh
t
wl
t
en
t
dis
t
ar
t
arw
t
arr
t
spr
—
—
B
C
A
—
—
—
Clock Pulse Duration, High
Clock Pulse Duration, Low
Input or I/O to Output Enabled
Input or I/O to Output Disabled
Input or I/O to Asynchronous Reset of Register
Asynchronous Reset Pulse Duration
Asynchronous Reset to Clock Recovery Time
Synchronous Preset to Clock Recovery Time
8
8
—
—
—
10
15
10
—
—
15
15
20
—
—
—
8
8
—
—
—
15
15
12
—
—
20
20
20
—
—
—
ns
ns
ns
ns
ns
ns
ns
ns
1) Refer to
Switching Test Conditions
section.
2) Calculated from
fmax
with internal feedback. Refer to
fmax Description
section.
3) Refer to
fmax Description
section.
Capacitance (T
A
= 25°C, f = 1.0 MHz)
SYMBOL
C
I
C
I/O
PARAMETER
Input Capacitance
I/O Capacitance
MAXIMUM*
8
10
UNITS
pF
pF
TEST CONDITIONS
V
CC
= 5.0V, V
I
= 2.0V
V
CC
= 5.0V, V
I/O
= 2.0V
*Characterized but not 100% tested.
9
LATTICE [ LATTICE SEMICONDUCTOR ]
