Specifications GAL16LV8ZD
AC Switching Characteristics
Over Recommended Operating Conditions
COM
-15
COM
-25
TEST
DESCRIPTION
PARAM
UNITS
COND.1
MIN. MAX.
MIN. MAX.
tpd
tco
tcf2
tsu
th
A
A
Input or I/O to Combinatorial Output
3
2
15
10
8
3
2
25
15
10
—
ns
ns
ns
ns
Clock to Output Delay
—
—
Clock to Feedback Delay
—
12
—
15
Setup Time, Input or Fdbk before Clk↑
Hold Time, Input or Fdbk after Clk↑
—
—
A
0
—
—
0
—
—
ns
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
45.5
33.3
MHz
fmax3
A
A
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
50
—
—
40
—
—
MHz
MHz
Maximum Clock Frequency with
No Feedback
62.5
41.6
twh
twl
—
—
B
Clock Pulse Duration, High
Clock Pulse Duration, Low
Input or I/O to Output Enabled
OE↓ to Output Enabled
8
—
—
17
16
18
17
12
12
—
—
—
—
—
—
25
20
25
20
ns
ns
ns
ns
ns
ns
8
ten
—
—
—
—
B
tdis
C
Input or I/O to Output Disabled
OE↑ to Output Disabled
C
1) Refer to Switching Test Conditions section.
2) Calculated from fmax with internal feedback. Refer to fmax Description section.
3) Refer to fmax Description section.
Capacitance (TA = 25°C, f = 1.0 MHz)
SYMBOL
PARAMETER
Input Capacitance
I/O Capacitance
TYPICAL
UNITS
pF
TEST CONDITIONS
VCC = 3.3V, VI = 0V
VCC = 3.3V, VI/O = 0V
CI
8
8
CI/O
pF
11
LATTICE [ LATTICE SEMICONDUCTOR ]
