Specifications ispLSI 5512VA
Switching Test Conditions
Figure 9. Test Load
Input Pulse Levels
GND to VCCIO
min
Input Rise and Fall Time
Input Timing Reference Levels
Ouput Timing Reference Levels
Output Load
≤ 1.5ns 10% to 90%
V
CCIO
1.5V
1.5V
R
1
2
See figure
Device
Output
Test
Point
Table 2 - 0003/5384
3-state levels are measured 0.5V from steady-state
active level.
R
C *
L
Output Load Conditions (See Figure 8)
*
C includes Test Fixture and Probe Capacitance.
L
3.3V
R2
316Ω 348Ω 511Ω 475Ω 35pF
2.5V
0213D
TEST CONDITION
R1
R1
R2
CL
A
Active High
Active Low
∞
348Ω
∞
475Ω 35pF
35pF
475Ω 5pF
B
316Ω
∞
511Ω
∞
Active High to Z
at VOH-0.5V
∞
348Ω
∞
C
D
Active Low to Z
at VOL+0.5V
316Ω
∞
∞
511Ω
∞
∞
5pF
Slow Slew
∞
∞
35pF
Table 2 - 0004A/5384
DC Electrical Characteristics for 3.3V Range1
Over Recommended Operating Conditions
SYMBOL
PARAMETER
CONDITION
MIN.
3.0
-0.3
2.0
–
TYP. MAX. UNITS
I/O Reference Voltage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
–
–
–
–
–
3.6
0.8
5.25
0.4
–
V
V
V
V
V
V
V
V
V
V
CCIO
IL
VOH ≤ VOUT or VOUT ≤ VOL (max)
VOH ≤ VOUT or VOUT ≤ VOL (max)
IOL = 8 mA
IH
OL
OH
IOH = -4 mA
2.4
Table 2-0007/5512VA
1. I/O voltage configuration must be set to VCC.
11
LATTICE [ LATTICE SEMICONDUCTOR ]
